Electrical characterization to 4 THz of N- and P-type GaAs using THz time-domain spectroscopy
Appl. Phys. Lett. 61, 840 (1992); doi:10.1063/1.107762
Issue Date: 17 August 1992
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Using a high-performance optoelectronic THz beam system for time-domain spectroscopy, we have measured the absorption and index of refraction of N- and P-type doped GaAs from low frequencies to 4 THz. From these measurements the complex conductance was obtained over the same frequency range. All of the results were well fit by Drude theory.
Applied Physics Letters is copyrighted by The American Institute of Physics.
| History: | Received 28 February 1992; accepted 2 June 1992 |
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0003-6951 (print)
1077-3118 (online)
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V and II

