Applied Physics Letters
   
 
 
 
Previous Article
Observation of a nanocrystalline-to-amorphous phase transition in luminescent porous silicon
Nanocrystalline silicon aggregates imbedded in a predominantly amorphous silicon layer have been observed in anodically etched p-Si(100) by using valence band x-ray photoelectron spectroscopy and latt...
Next Article
Alternating current losses in Bi2Sr2Ca1Cu2O8 + delta /Ag tapes at power frequencies
Measurements of transport alternating-current (ac) losses in Bi2Sr2CaCu2O8 + x powder-in-tube Ag-sheathed tapes at 4.2 and 65 K and at 20, 60, 200, and 400 Hz were carried out and comparisons to the t...

Magnetic imaging of moat-guarded superconducting electronic circuits

Appl. Phys. Lett. 67, 1769 (1995); doi:10.1063/1.114377

Issue Date: 18 September 1995

You are not logged in to this journal. Log in

Mark Jeffery and T. Van Duzer
Department of Electrical Engineering and Computer Sciences, The University of California, Berkeley, California 94720-1770

J. R. Kirtley and M. B. Ketchen
IBM Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598
Superconducting electronic circuits surrounded by various configurations of holes in the superconducting ground plane have been imaged using a high resolution scanning superconducting quantum interference device (SQUID) microscope. These data demonstrate that in the weak field limit continuous moats trap flux more effectively to protect the circuits than small holes in the same configuration. ©1995 American Institute of Physics.
History: Received 29 June 1995; accepted 24 July 1995
Permalink: http://link.aip.org/link/?APPLAB/67/1769/1
BUY THIS ARTICLE   (US$28)
Download PDF (296 kB) View Cart

KEYWORDS and PACS

Keywords
PACS
  • 74.60.Ge
    Superconductivity Type-II superconductivity Flux pinning, flux creep, and flux-line lattice dynamics
  • 85.25.Dq
    Electrical and magnetic devices Superconducting devices; superconducting magnets Superconducting quantum interference devices (SQUIDs) (including magnetometers, electromagnetic radiation sources and detectors, and computer logic and memory devices)
  • YEAR: 1995

RELATED DATABASES


To view database links for this article,
you need to log in.
To view database links for this article,
you need to log in.

PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (9)

For access to fully linked references, you need to log in. For access to fully linked references, you need to Log in.
  1. For a review see S. Hasuo and T. Imamura, Proc. IEEE 77, 1177 (1989).
  2. K. K. Likharev and V. K. Semenov, IEEE Trans. Appl. Supercond. 1, 3 (1991).
  3. N. Fujimaki, S. Kotani, T. Imamura, and S. Hasuo, IEEE Trans. Electron Devices 36, 433 (1989).
  4. S. Kotani, N. Fujimaki, T. Imamura, and S. Hasuo, 1988 IEEE International Solid-State Circuits Conference, Digest of Technical Papers, 1st ed., edited by L. Winner (IEEE, New York, 1988), pp. 150–151, 341.
  5. N. Takezawa and K. Fukushima, Physica C 228, 149 (1994).
  6. M. B. Ketchen, D. J. Herrell, and C. J. Anderson, J. Appl. Phys. 57, 2550 (1985).
  7. S. Bermon and T. Gheewala, IEEE Trans. Magn. MAG-19, 1160 (1983).
  8. J. R. Kirtley, M. B. Ketchen, K. G. Stawiasz, J. Z. Sun, W. J. Gallagher, S. H. Blanton, and S. J. Wind, Appl. Phys. Lett. 66, 1138 (1995).
  9. C. C. Tsuei, J. R. Kirtley, C. C. Chi, L. S. Yu-Jahnes, A. Gupta, T. Shaw, J. Z. Sun, and M. B. Ketchen, Phys. Rev. Lett. 73, 593 (1994).

CITING ARTICLES

For access to citing articles, you need to log in.
For access to citing articles, you need to Log in.