A low-loss composition region identified from a thin-film composition spread of (Ba1 x ySrxCay)TiO3
Appl. Phys. Lett. 74, 1165 (1999); doi:10.1063/1.123475
Issue Date: 22 February 1999
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We have generated the thin-film ternary composition spread of (Ba1 x ySrxCay)TiO3 on an equilateral-triangle-shaped LaAlO3 substrate. Compositional variation within the triangle was achieved by a precisely controlled shutter system inside a pulsed laser deposition chamber, which allows the deposition of precursors with gradient thickness over the length of the substrate. Appropriate postannealing afforded high-quality epitaxial thin films over almost the entire composition region. Mapping of the microwave dielectric properties of the composition-spread chip was performed using a scanning evanescent microwave microscope at 1 GHz. Composition region Ba0.120.25Sr0.350.47Ca0.320.53TiO3 was found to have desirable properties for electronic applications. ©1999 American Institute of Physics.
| History: | Received 29 October 1998; accepted 21 December 1998 |
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http://link.aip.org/link/?APPLAB/74/1165/1 |
KEYWORDS and PACS
THIN FILMS,
FERROELECTRIC MATERIALS,
CHEMICAL COMPOSITION,
BARIUM OXIDES,
STRONTIUM OXIDES,
CALCIUM OXIDES,
TITANATES,
EPITAXY,
DIELECTRIC PROPERTIES,
barium compounds,
strontium compounds,
calcium compounds,
microwave materials,
ferroelectric thin films,
epitaxial layers,
permittivity,
dielectric losses,
pulsed laser deposition,
annealing,
scanning probe microscopy,
microwave imaging
- 77.84.Dy
Dielectrics, piezoelectrics, and ferroelectrics and their properties Dielectric, piezoelectric, ferroelectric, and antiferroelectric materials Niobates, titanates, tantalates, PZT ceramics, etc. - 84.40.-x
Electronics; radiowave and microwave technology; direct energy conversion and storage Radiowave and microwave (including millimeter wave) technology - 77.55.+f
Dielectrics, piezoelectrics, and ferroelectrics and their properties Dielectric thin films - 68.55.Nq
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology Composition and phase identification - 77.80.-e
Dielectrics, piezoelectrics, and ferroelectrics and their properties Ferroelectricity and antiferroelectricity - 77.22.Ch
Dielectrics, piezoelectrics, and ferroelectrics and their properties Dielectric properties of solids and liquids Permittivity (dielectric function) - 77.22.Gm
Dielectrics, piezoelectrics, and ferroelectrics and their properties Dielectric properties of solids and liquids Dielectric loss and relaxation - 81.15.Fg
Materials science Methods of deposition of films and coatings; film growth and epitaxy Laser deposition - 61.72.Cc
Structure of solids and liquids; crystallography Defects and impurities in crystals; microstructure Kinetics of defect formation and annealing - YEAR: 1999
RELATED DATABASES
PUBLICATION DATA
0003-6951 (print)
1077-3118 (online)
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