Applied Physics Letters
Search:
   
 
 
 
Previous Article
Suppression of structural and magnetotransport transitions in compressed Pr0.5Sr0.5MnO3 thin films resulting in colossal magnetoresistance effect
Thin films of Pr0.5Sr0.5MnO3 have been deposited on [100]-LaAlO3 using laser ablation. In contrast to the bulk compounds, such films do not exhibit any structural and magnetotransport transitions vers...
Next Article
Surface spin-glass behavior in La2/3Sr1/3MnO3 nanoparticles
The low-temperature magnetic and transport properties of La2/3Sr1/3MnO3 nanoparticles have been investigated. It is found that a surface spin-glass behavior exists in La2/3Sr1/3MnO3 nanoparticles, whi...

Structural and magnetic properties of eta-phase manganese nitride films grown by molecular-beam epitaxy

Appl. Phys. Lett. 78, 3860 (2001); doi:10.1063/1.1378800

Issue Date: 11 June 2001

You are not logged in to this journal. Log in

Haiqiang Yang, Hamad Al-Brithen, and Arthur R. Smith
Department of Physics and Astronomy, Ohio University, Athens, Ohio 45701

J. A. Borchers, R. L. Cappelletti, and M. D. Vaudin
National Institute of Standards and Technology, Gaithersburg, Maryland 208990-8562
Face-centered tetragonal (fct) eta-phase manganese nitride films have been grown on magnesium oxide (001) substrates by molecular-beam epitaxy. For growth conditions described here, reflection high energy electron diffraction and neutron scattering show primarily two types of domains rotated by 90° to each other with their c axes in the surface plane. Scanning tunneling microscopy images reveal surface domains consisting of row structures which correspond directly to the bulk domains. Neutron diffraction data confirm that the Mn moments are aligned in a layered antiferromagnetic structure. The data are consistent with the fct model of G. Kreiner and H. Jacobs for bulk Mn3N2 [J. Alloys Compd. 183, 345 (1992)]. ©2001 American Institute of Physics.
History: Received 20 March 2001; accepted 20 April 2001
Permalink: http://link.aip.org/link/?APPLAB/78/3860/1
BUY THIS ARTICLE   (US$24)
Download HTML Download Sectioned HTML Download PDF (339 kB) View Cart

KEYWORDS and PACS

Keywords
PACS
  • 68.35.Bs
    Surfaces and interfaces; thin films and low-dimensional systems (structure and nonelectronic properties) Solid surfaces and solid-solid interfaces: Structure and energetics Structure of clean surfaces (reconstruction)
  • 75.50.Ee
    Magnetic properties and materials Studies of specific magnetic materials Antiferromagnetics
  • 68.55.Jk
    Surfaces and interfaces; thin films and low-dimensional systems (structure and nonelectronic properties) Thin film structure and morphology Structure and morphology; thickness; crystalline orientation and texture
  • 75.70.Ak
    Magnetic properties and materials Magnetic properties of thin films, surfaces, and interfaces Magnetic properties of monolayers and thin films
  • 81.15.Hi
    Materials science Methods of deposition of films and coatings; film growth and epitaxy Molecular, atomic, ion, and chemical beam epitaxy
  • 68.37.Ef
    Surfaces and interfaces; thin films and low-dimensional systems (structure and nonelectronic properties) Microscopy of surfaces, interfaces, and thin films Scanning tunneling microscopy (including chemistry induced with STM)
  • YEAR: 2001

RELATED DATABASES


To view database links for this article,
you need to log in.
To view database links for this article,
you need to log in.

PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (16)

For access to fully linked references, you need to log in. For access to fully linked references, you need to Log in.
  1. J. P. Dismukes, W. M. Yim, and V. S. Ban, J. Cryst. Growth 13, 365 (1972).
  2. T. D. Moustakas, R. J. Molnar, and J. P. Dismukes, Electrochem. Soc. Proceedings 11, 197 (1996).
  3. D. Gall, I. Petrov, P. Desjardins, and J. E. Greene, J. Appl. Phys. 86, 5524 (1999).
  4. D. Gall, I. Petrov, N. Hellgren, L. Hultman, J. E. Sundgren, and J. E. Greene, J. Appl. Phys. 84, 6034 (1998).
  5. H. A. H. Al-Brithen and A. R. Smith, Appl. Phys. Lett. 77, 2485 (2000).
  6. A. R. Smith, H. A. H. Al-Brithen, and D. Gall (unpublished).
  7. S. Yang, D. B. Lewis, I. Wadsworth, J. Cawley, J. S. Brooks, and W. D. Munz, Surf. Coat. Technol. 131, 228 (2000);
  8. K. Inumaru, T. Ohara, and S. Yamanaka, Appl. Surf. Sci. 158, 375 (2000).
  9. G. Kreiner and H. Jacobs, J. Alloys Compd. 183, 345 (1992).
  10. K. Suzuki, T. Kaneko, H. Yoshida, Y. Obi, H. Fujimori, and H. Morita, J. Alloys Compd. 306, 66 (2000).
  11. K. Suzuki, H. Morita, T. Kandeko, H. Yoshida, and H. Fujimori, J. Alloys Compd. 201, 11 (1993).
  12. K. Suzuki, T. Kaneko, H. Yoshida, H. Morita, and H. Fujimori, J. Alloys Compd. 224, 232 (1995).
  13. T. Dietl, H. Ohno, F. Matsukura, J. Ciberg, and D. Ferrand, Science 287, 1019 (2000).
  14. H. Ohno, Science 281, 951 (1998).
  15. Y. Ohno, D. K. Young, B. Beschoten, F. Matsukura, H. Ohno, and D. D. Awschalom, Nature (London) 402, 790 (1999).
  16. Inorganic Index to Powder Diffraction File (Joint Committee on Powder Diffraction Standards, International Center for Powder Diffraction Data, Swarthmore, PA, 1997): MgO–Card No. 04-0820.
  17. The STM xy calibration is approximately known from previous studies of other systems, including ScN(001) and GaN(0001) but not to better than a few percent here.

CITING ARTICLES

For access to citing articles, you need to log in.
For access to citing articles, you need to Log in.