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Scanning probe electromagnetic tweezers

Appl. Phys. Lett. 79, 1897 (2001); doi:10.1063/1.1402963

Issue Date: 17 September 2001

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Mladen Barbic, Jack J. Mock, Andrew P. Gray, and S. Schultz
Department of Physics, University of California–San Diego, La Jolla, California 92093-0319
We present a micromanipulation technique that utilizes integrated microcoils and magnetic microtips for localized positioning of micron-sized magnetic objects. Forces of 10 pN, and submicron positioning control are demonstrated on the 2.8 µm diameter superparamagnetic beads. The technique also implements an optical illumination scheme that provides a clear viewing of the magnetically trapped objects without including the scattering background from the magnetic manipulator tip. This simple instrument provides a noninvasive, low cost alternative to the optical trapping techniques normally used in micromanipulation. Among the possible advantages are the negligible heating of the manipulated sample, effective decoupling of the manipulation component of the experiment from the optical studies of the systems of interest, and the ability to perform studies in a variety of fluids. ©2001 American Institute of Physics.
History: Received 26 March 2001; accepted 16 July 2001
Permalink: http://link.aip.org/link/?APPLAB/79/1897/1
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KEYWORDS and PACS

Keywords
PACS
  • 06.60.Sx
    Metrology, measurements, and laboratory procedures Laboratory procedures Positioning and alignment; manipulating, remote handling
  • 81.16.Ta
    Materials science Methods of nanofabrication and processing Atom manipulation
  • 75.50.Tt
    Magnetic properties and materials Studies of specific magnetic materials Fine-particle systems; nanocrystalline materials
  • 07.79.-v
    Instruments, apparatus, and components common to several branches of physics and astronomy Scanning probe microscopes and components
  • YEAR: 2001

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ISSN:
0003-6951 (print)   1077-3118 (online)
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