Photoluminescence study of AlGaN-based 280 nm ultraviolet light-emitting diodes
Appl. Phys. Lett. 83, 4083 (2003); doi:10.1063/1.1626808
Issue Date: 17 November 2003
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We investigated optical properties of single quantum well AlGaN-based UV 280 nm light-emitting diodes using temperature-dependent photoluminescence (PL) measurement. We found an "S-shaped" temperature dependence of the peak energy. From the Arrhenius plot of integrated PL intensity, we speculate that dislocations as well as thermal emission of carriers out of the quantum well are responsible for the PL quenching behavior. Also a second nonradiative channel with much lower activation energy was found, the origin of which we believe to be quenching of the bound excitons. ©2003 American Institute of Physics.
| History: | Received 22 May 2003; accepted 29 September 2003 |
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KEYWORDS and PACS
aluminium compounds,
gallium compounds,
III-V semiconductors,
wide band gap semiconductors,
semiconductor quantum wells,
quantum well devices,
light emitting diodes,
photoluminescence,
spectral line intensity,
dislocations,
nonradiative transitions,
radiation quenching,
excitons
- 85.35.Be
Quantum well devices including quantum dots, quantum wires, etc - 85.60.Jb
Light-emitting devices - 78.67.De
Optical properties of quantum wells - 73.21.Fg
Quantum wells (electron states/collective excitations) - 78.55.Cr
Photoluminescence in IIIV semiconductors - 61.72.Hh
Indirect evidence of dislocations and other defects including resistivity, slip, creep, strains, internal friction, EPR, NMR, etc. - 61.72.Lk
Linear defects: dislocations, disclinations - 73.20.Mf
Collective excitations (surface/interface states) including excitons, polarons, plasmons and other charge-density excitations - 71.35.Cc
Intrinsic properties of excitons; optical absorption spectra - YEAR: 2003
RELATED DATABASES
PUBLICATION DATA
0003-6951 (print)
1077-3118 (online)
REFERENCES (16)
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