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Observation of spontaneous ordering in the optoelectronic material GaInNP

Appl. Phys. Lett. 84, 1299 (2004); doi:10.1063/1.1650045

Issue Date: 23 February 2004

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Y. K. Su, C. H. Wu, S. H. Hsu, S. J. Chang, and W. C. Chen
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan, Republic of China

Y. S. Huang and H. P. Hsu
Department of Electronic Engineering, National Taiwan University of Science and Technology, Taipei 106, Taiwan, Republic of China
We report a detailed structural and optical characterization of high-quality GaInNP films. These films were grown by gas-source molecular-beam epitaxy on GaAs (100) substrates. These epitaxial layers were then characterized by a high-resolution x-ray rocking curve (HRXRC) and photoluminescence (PL) measurements. With nitrogen incorporation, the PL peak redshifts, indicating bandgap reduction and the line-width broadening increases due to alloy scattering. The anisotropic properties of the polarized HRXRC and polarized piezoreflectance spectra are used to prove the spontaneous ordering in GaInP incorporating nitrogen. Furthermore, ordering-induced superlattice-like microstructure shown in high-resolution transmission electron microscope images is used to confirm the spontaneous ordering in Ga0.44In0.56NxP1–x epitaxial layers. ©2004 American Institute of Physics.
History: Received 30 October 2003; accepted 19 December 2003
Permalink: http://link.aip.org/link/?APPLAB/84/1299/1
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KEYWORDS and PACS

Keywords
PACS
  • 68.55.Jk
    Thin film structure and morphology; thickness; crystalline orientation and texture
  • 78.55.Cr
    Photoluminescence in III–V semiconductors
  • 78.66.Fd
    Optical properties of III–V semiconductors (thin films)
  • 81.05.Ea
    III–V semiconductors: fabrication, treatment, testing and analysis
  • 78.20.Hp
    Piezo-, elasto-, and acoustooptical effects (bulk materials/thin films) including photoacoustic effects
  • 81.15.Hi
    Molecular, atomic, ion, and chemical beam epitaxy
  • YEAR: 2004

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PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
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