Self-assembling fluidic machines
This letter describes dynamic self-assembly of two-component rotors floating at the interface between liquid and air into simple, reconfigurable mechanical systems ("machines"). The rotors a...
This letter describes dynamic self-assembly of two-component rotors floating at the interface between liquid and air into simple, reconfigurable mechanical systems ("machines"). The rotors a...
Intense electron emission from graphite nanocraters and their application to time-resolved x-ray radiography
A high-density electron emission more than 20 mA/cm2 was achieved from a cold cathode fabricated by simple plasma etching nanocraters onto a graphite substrate. The magnitude of the field enhancement ...
A high-density electron emission more than 20 mA/cm2 was achieved from a cold cathode fabricated by simple plasma etching nanocraters onto a graphite substrate. The magnitude of the field enhancement ...
Accurate formulas for interaction force and energy in frequency modulation force spectroscopy
Appl. Phys. Lett. 84, 1801 (2004); doi:10.1063/1.1667267
Issue Date: 8 March 2004
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Frequency modulation atomic force microscopy utilizes the change in resonant frequency of a cantilever to detect variations in the interaction force between cantilever tip and sample. While a simple relation exists enabling the frequency shift to be determined for a given force law, the required complementary inverse relation does not exist for arbitrary oscillation amplitudes of the cantilever. In this letter we address this problem and present simple yet accurate formulas that enable the interaction force and energy to be determined directly from the measured frequency shift. These formulas are valid for any oscillation amplitude and interaction force, and are therefore of widespread applicability in frequency modulation dynamic force spectroscopy. ©2004 American Institute of Physics.
| History: | Received 31 October 2003; accepted 15 January 2004 |
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http://link.aip.org/link/?APPLAB/84/1801/1 |
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