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Fluctuation microscopy studies of medium-range ordering in amorphous diamond-like carbon films

Appl. Phys. Lett. 84, 2823 (2004); doi:10.1063/1.1713048

Issue Date: 12 April 2004

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Xidong Chen
Cedarville University, Cedarville, Ohio 45314
Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439

J. P. Sullivan and T. A. Friedmann
Nanostructure and Semiconductor Physics Department, Sandia National Laboratories, Albuquerque, New Mexico 87185

J. Murray Gibson
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439
In this letter, we report fluctuation microscopy studies of medium-range ordering in amorphous diamond-like carbon films and the effect of annealing on this ordering. Annealed and unannealed diamond-like carbon films have almost identical short-range order. Our fluctuation microscopy results, however, indicate the presence of medium range order or clustering in the films on a lateral length scale that exceeds 1 nm. Within the clustered regions, the dominant local ordering appears to be diamond-like, and graphite-like ordering is not observed. Thermal annealing up to 600 °C leads to an increase in diamond-like clustering with no onset of graphite-like clustering. However, after high temperature annealing up to 1000 °C, graphite-like clustering becomes apparent as a result of the conversion of diamond-like carbon to graphite-like carbon. The results on the as-deposited films and films annealed up to 600 °C suggest that a spontaneous medium range ordering process occurs in diamond-like carbon films during and subsequent to film growth, and this may play an important role in stress relaxation. ©2004 American Institute of Physics.
History: Received 5 August 2003; accepted 25 February 2004
Permalink: http://link.aip.org/link/?APPLAB/84/2823/1
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KEYWORDS and PACS

Keywords
PACS
  • 68.55.Jk
    Thin film structure and morphology; thickness; crystalline orientation and texture
  • 68.37.-d
    Microscopy of surfaces, interfaces, and thin films
  • 61.43.Er
    Structure of other amorphous solids excluding amorphous semiconductors, metals, and alloys, glasses, powders and porous materials
  • 81.40.Ef
    Cold working, work hardening and annealing including post-deformation annealing, quenching, tempering recovery, and crystallization
  • 62.40.+i
    Anelasticity, internal friction, stress relaxation, and mechanical resonances
  • 81.40.Jj
    Elasticity and anelasticity, stress-strain relations
  • YEAR: 2004

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PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
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REFERENCES (17)
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  1. J. Robertson, Prog. Solid State Chem. 21, 199 (1991).
  2. J. P. Sullivan, T. A. Friedmann, and K. J. Hjort, MRS Bull. 26, 309 (2001).
  3. J. Robertson, Adv. Phys. 35, 317 (1986).
  4. A. C. Ferrari, B. Kleinsorge, G. Adamopoulos, J. Robertson, W. I. Milne, V. Stolojan, L. M. Brown, A. LiBassi, and B. K. Tanner, J. Non-Cryst. Solids 266–269, 765 (2000).
  5. P. J. Fallon, V. S. Veerasamy, C. A. Davis, J. Robertson, G. A. J. Amaratunga, W. I. Milne, and J. Koskinen, Phys. Rev. B 48, 4777 (1993).
  6. T. M. Alam, T. A. Friedmann, P. A. Schultz, and D. Sebastiani, Phys. Rev. B 67, 245309 (2003).
  7. J. M. Gibson and M. M. J. Treacy, Phys. Rev. Lett. 78, 1074 (1997).
  8. P. B. Hirsh, A. Howie, R. B. Nicholson, and D. W. Pawshley, Electron Microscopy of Thin Crystals (Butterworths, Washington, DC, 1965).
  9. X. Chen, J. M. Gibson, J. Sullivan, and T. Friedmann, Symposium W, Materials Research Society Spring Meeting, 16–20 April 2001.
  10. J. P. Sullivan, T. A. Friedmann, and A. G. Baca, J. Electron. Mater. 26, 1021 (1997).
  11. S. R. Elliot, Physics of Amorphous Materials (Longman, 1990).
  12. T. M. Alam, T. A. Friedmann, and A. J. G. Jurewicz, in Thin Films: Preparation, Characterization, Applications, edited by Soriaga et al. (Kluwer Academic/Plenum, New York, 2002), pp. 277–289.
  13. P. A. Schultz and E. B. Stechel, Phys. Rev. B 57, 3295 (1998).
  14. T. A. Friedmann, K. F. McCarty, J. C. Barbour, M. P. Siegal, and D. C. Dibble, Appl. Phys. Lett. 68, 1643 (1996).
  15. S. Anders, J. Diaz, J. W. Ager, R. Y. Lo, and D. B. Bogy, Appl. Phys. Lett. 71, 3367 (1997).
  16. A. C. Ferrari, B. Kleinsorge, N. A. Morrison, A. Hart, V. Stolojan, and J. Robertson, J. Appl. Phys. 85, 7191 (1999).
  17. M. P. Siegal, D. R. Tallant, P. N. Provencio, D. L. Overmyer, R. L. Simpson, and L. J. Martinez-Miranda, Appl. Phys. Lett. 76, 3052 (2000).

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