Evolution of dislocation arrays in epitaxial BaTiO3 thin films grown on (100) SrTiO3
Appl. Phys. Lett. 84, 3298 (2004); doi:10.1063/1.1728300
Issue Date: 26 April 2004
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Dislocation arrays and dislocation half-loops in BaTiO3 thin films were characterized using transmission electron microscopy (TEM). BaTiO3 films with thicknesses ranging from 2 to 20 nm were grown on (100) SrTiO3 by reactive molecular beam epitaxy (MBE). The critical thickness for dislocations to occur in this system was found to lie between 2 and 4 nm. The misfit dislocations are mainly
100
type. The average spacing between the dislocations in the array becomes smaller when the film is thicker, which indicates gradual relaxation of mismatch strain with increasing film thickness.©2004 American Institute of Physics.
100
type. The average spacing between the dislocations in the array becomes smaller when the film is thicker, which indicates gradual relaxation of mismatch strain with increasing film thickness.©2004 American Institute of Physics.
| History: | Received 29 September 2003; accepted 1 March 2004 |
| Permalink: |
http://link.aip.org/link/?APPLAB/84/3298/1 |
KEYWORDS and PACS
barium compounds,
ferroelectric thin films,
molecular beam epitaxial growth,
epitaxial layers,
dislocation arrays,
stress relaxation,
transmission electron microscopy
- 61.72.Ff
Direct observation of dislocations and other defects including etch pits, decoration, electron microscopy, x-ray topography, etc. - 61.72.Lk
Linear defects: dislocations, disclinations - 77.55.+f
Dielectric thin films - 81.15.Hi
Molecular, atomic, ion, and chemical beam epitaxy - 77.80.-e
Ferroelectricity and antiferroelectricity - 81.40.Jj
Elasticity and anelasticity, stress-strain relations - 62.40.+i
Anelasticity, internal friction, stress relaxation, and mechanical resonances - 77.84.Dy
Dielectric, piezoelectric, and ferroelectric niobates, titanates, tantalates, PZT ceramics, etc - 68.37.Lp
Transmission electron microscopy (TEM) of surfaces, interfaces and thin films including STEM, HRTEM, etc - YEAR: 2004
RELATED DATABASES
PUBLICATION DATA
0003-6951 (print)
1077-3118 (online)
REFERENCES (23)
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