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X-ray studies of the growth of smooth Ag films on Ge(111)-c(2×8)

Appl. Phys. Lett. 84, 4995 (2004); doi:10.1063/1.1763212

Published 28 May 2004

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L. Basile
Department of Physics, University of Illinois at Urbana–Champaign, 1110 West Green Street, Urbana, Illinois 61801-3080
Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana–Champaign, 104 South Goodwin Avenue, Urbana, Illinois 61801-2902

Hawoong Hong
Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana–Champaign, 104 South Goodwin Avenue, Urbana, Illinois 61801-2902

P. Czoschke and T.-C. Chiang
Department of Physics, University of Illinois at Urbana–Champaign, 1110 West Green Street, Urbana, Illinois 61801-3080
Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana–Champaign, 104 South Goodwin Avenue, Urbana, Illinois 61801-2902
We have performed in situ reflectivity measurements using synchrotron radiation of Ag films deposited on Ge(111) over the thickness range of 3–12 atomic layers. The films deposited at a substrate temperature of 110 K are not well ordered, but become well ordered upon annealing, as evidenced by substantial changes in the x-ray reflectivity data. The thickness distribution for each annealed film, deduced from a fit to the reflectivity data, is remarkably narrow, with just two or three adjacent discrete thicknesses present, despite the large lattice mismatch between Ag and Ge. In some cases, the film thickness is nearly atomically uniform. The results are discussed in connection with recent models and theories of electronic effects on the growth of ultrathin metal films. ©2004 American Institute of Physics.
History: Received 1 March 2004; accepted 27 April 2004; published 28 May 2004
Permalink: http://link.aip.org/link/?APPLAB/84/4995/1
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KEYWORDS and PACS

Keywords
PACS
  • 68.55.Jk
    Thin film structure and morphology; thickness; crystalline orientation and texture
  • 81.15.Ef
    Vacuum deposition
  • 81.40.Gh
    Other heat and thermomechanical treatments
  • 68.49.Uv
    X-ray standing waves (surface characterization)
  • 68.35.Bs
    Structure of clean solid surfaces (reconstruction)
  • YEAR: 2004

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PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
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