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Time-resolved detection of individual electrons in a quantum dot

Appl. Phys. Lett. 85, 2005 (2004); doi:10.1063/1.1784875

Issue Date: 13 September 2004

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R. Schleser, E. Ruh, T. Ihn, and K. Ensslin
Solid State Physics Laboratory, ETH Zürich, 8093 Zürich, Switzerland

D. C. Driscoll and A. C. Gossard
Materials Department, University of California, Santa Barbara, California 93106
We present measurements on a quantum dot and a nearby, capacitively coupled, quantum point contact used as a charge detector. With the dot being weakly coupled to only a single reservoir, the transfer of individual electrons onto and off the dot can be observed in real time in the current signal from the quantum point contact. From these time-dependent traces, the quantum mechanical coupling between dot and reservoir can be extracted quantitatively. A similar analysis allows the determination of the occupation probability of the dot states. ©2004 American Institute of Physics
History: Received 12 April 2004; accepted 22 June 2004
Permalink: http://link.aip.org/link/?APPLAB/85/2005/1
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KEYWORDS and PACS

Keywords
PACS
  • 73.40.Lq
    Electrical properties of other semiconductor-to-semiconductor contacts, p–n junctions, and heterojunctions excluding III–V semiconductor-to-semiconductor
  • 68.37.Ps
    Atomic force microscopy (AFM) of surfaces, interfaces and thin films
  • 73.61.Ey
    Electrical properties of III–V semiconductors (thin films)
  • YEAR: 2004

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PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
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