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Quantitative force measurements in liquid using frequency modulation atomic force microscopy

Appl. Phys. Lett. 85, 3575 (2004); doi:10.1063/1.1803932

Issue Date: 18 October 2004

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Takayuki Uchihashi, Michael J. Higgins, Satoshi Yasuda, and Suzanne P. Jarvis
SFI Nanoscience Laboratory, Trinity College, Dublin 2, Ireland

Seiji Akita and Yoshikazu Nakayama
Department of Physics and Electronics, Osaka Prefecture University, Osaka 599–8531, Japan

John E. Sader
Department of Mathematics and Statistics, University of Melbourne, Victoria, 3010, Australia
The measurement of short-range forces with the atomic force microscope (AFM) typically requires implementation of dynamic techniques to maintain sensitivity and stability. While frequency modulation atomic force microscopy (FM-AFM) is used widely for high-resolution imaging and quantitative force measurements in vacuum, quantitative force measurements using FM-AFM in liquids have proven elusive. Here we demonstrate that the formalism derived for operation in vacuum can also be used in liquids, provided certain modifications are implemented. To facilitate comparison with previous measurements taken using surface forces apparatus, we choose a model system (octamethylcyclotetrasiloxane) that is known to exhibit short-ranged structural ordering when confined between two surfaces. Force measurements obtained are found to be in excellent agreement with previously reported results. This study therefore establishes FM-AFM as a powerful tool for the quantitative measurement of forces in liquid. ©2004 American Institute of Physics
History: Received 24 June 2004; accepted 6 August 2004
Permalink: http://link.aip.org/link/?APPLAB/85/3575/1
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KEYWORDS and PACS

Keywords
PACS
  • 68.15.+e
    Liquid thin films
  • 68.37.Ps
    Atomic force microscopy (AFM) of surfaces, interfaces and thin films
  • YEAR: 2004

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ISSN:
0003-6951 (print)   1077-3118 (online)
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