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Monte Carlo simulation of Joule heating in bulk and strained silicon

Appl. Phys. Lett. 86, 082101 (2005); doi:10.1063/1.1870106

Published 16 February 2005

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Eric Pop and Robert W. Dutton
Department of Electrical Engineering, Stanford University, Stanford, California 94305

Kenneth E. Goodson
Department of Mechanical Engineering, Stanford University, Stanford, California 94305
This work examines the details of Joule heating in silicon with a Monte Carlo method including efficient, analytic models for the electron bands, acoustic and optical phonon dispersion. We find that a significant portion of the initially generated phonons have low group velocity, and therefore low contribution to heat transport, e.g., optical phonons or acoustic modes near the Brillouin zone edge. The generated phonon spectrum in strained silicon is different from bulk silicon at low electric fields due to band splitting and scattering selection rules which favor g-type and reduce f-type phonon emission. However, heat generation is essentially the same in strained and bulk silicon at high fields, when electrons have enough energy to emit across the entire phonon spectrum despite the strain-induced band splitting. The results of this study are important for electro-thermal analysis of future silicon nanoscale devices. ©2005 American Institute of Physics
History: Received 30 August 2004; accepted 19 January 2005; published 16 February 2005
Permalink: http://link.aip.org/link/?APPLAB/86/082101/1
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KEYWORDS and PACS

Keywords
PACS
  • 63.20.Dj
    Phonon states and bands, normal modes, and phonon dispersion
  • 71.20.Mq
    Electronic structure of crystalline elemental semiconductors
  • 71.15.Dx
    Computational methodology (condensed matter electronic structure) including Brillouin zone sampling, iterative diagonalization, pseudopotential construction
  • 71.15.Pd
    Molecular dynamics calculations and other numerical simulations (condensed matter electronic structure) including Car–Parinello
  • YEAR: 2005

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PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
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