Piezoresistance of carbon nanotubes on deformable thin-film membranes
Appl. Phys. Lett. 86, 093104 (2005); doi:10.1063/1.1872221
Published 23 February 2005
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Carbon nanotubes have interesting electromechanical properties that may enable a new class of nanoscale mechanical sensors. We fabricated two-terminal nanotube devices on silicon nitride membranes, measured their electronic transport versus strain, and estimated their band gaps and the strain-induced changes in them. We found band-gap increases and decreases among both semiconducting and small-gap semiconducting (SGS) tubes. The SGS band gaps exceeded the predicted curvature-induced gaps for their diameter. Some of the band-gap changes for both types of tubes exceeded the predicted maxima. These anomalies are likely caused by interaction with the rough silicon nitride surface.
©2005 American Institute of Physics
| History: | Received 8 September 2004; accepted 10 January 2005; published 23 February 2005 |
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http://link.aip.org/link/?APPLAB/86/093104/1 |
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0003-6951 (print)
1077-3118 (online)
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