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Optical loss and lasing characteristics of high-quality-factor AlGaAs microdisk resonators with embedded quantum dots

Appl. Phys. Lett. 86, 151106 (2005); doi:10.1063/1.1901810

Published 6 April 2005

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Kartik Srinivasan, Matthew Borselli, Thomas J. Johnson, Paul E. Barclay, and Oskar Painter
Thomas J. Watson, Sr. Laboratory of Applied Physics, California Institute of Technology, Pasadena, California 91125

Andreas Stintz and Sanjay Krishna
Center for High Technology Materials, University of New Mexico, Albuquerque, New Mexico 87106
Optical characterization of AlGaAs microdisk resonant cavities with a quantum dot active region is presented. Direct passive measurement of the optical loss within AlGaAs microdisk resonant structures embedded with InAs/InGaAs dots-in-a-well (DWELL) is performed using an optical-fiber-based probing technique at a wavelength (lambda~1.4  µm) that is red detuned from the dot emission wavelength (lambda~1.2  µm). Measurements in the 1.4  µm wavelength band on microdisks of diameter D=4.5  µm show that these structures support modes with cold-cavity quality factors as high as 3.6×105. DWELL-containing microdisks are then studied through optical pumping at room temperature. Pulsed lasing at lambda~1.2  µm is seen for cavities containing a single layer of InAs dots, with threshold values of ~17  µW, approaching the estimated material transparency level. Room-temperature continuous-wave operation is also observed. ©2005 American Institute of Physics
History: Received 16 December 2004; accepted 28 February 2005; published 6 April 2005
Permalink: http://link.aip.org/link/?APPLAB/86/151106/1
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KEYWORDS and PACS

Keywords
PACS
  • 42.55.Px
    Semiconductor lasers; laser diodes
  • 42.55.Sa
    Microcavity and microdisk lasers
  • 42.60.Da
    Laser resonators, cavities, amplifiers, arrays, and rings
  • 42.60.Jf
    Laser beam characteristics including profile, intensity, and power; spatial pattern formation
  • 85.35.Be
    Quantum well devices including quantum dots, quantum wires, etc
  • YEAR: 2005

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PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
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REFERENCES (21)
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