Charging efficiency and lifetime of image-bound electrons on a dielectric surface
Appl. Phys. Lett. 86, 162111 (2005); doi:10.1063/1.1906314
Published 14 April 2005
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The surface charge generated on an Al0.24Ga0.76As/GaAs quantum well sample by electron bombardment was monitored by measuring the change in the conductivity of the channel. Upon turning off the electron bombardment the surface charge on adsorbed layers of xenon and water at 8 K decays in room temperature darkness with a lifetime
=0.30±0.02 s. The average charging efficiency, µ0, defined as the ratio of the charge collected by the surface to the beam current times the charging time, is µ0
0.001. Surface charging proves to be an effective method for contactless gating of field effect devices.
©2005 American Institute of Physics
=0.30±0.02 s. The average charging efficiency, µ0, defined as the ratio of the charge collected by the surface to the beam current times the charging time, is µ0
0.001. Surface charging proves to be an effective method for contactless gating of field effect devices.
©2005 American Institute of Physics
| History: | Received 15 February 2005; accepted 21 March 2005; published 14 April 2005 |
| Permalink: |
http://link.aip.org/link/?APPLAB/86/162111/1 |
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0003-6951 (print)
1077-3118 (online)
REFERENCES (17)
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- K. Nagesha and L. Sanche, Phys. Rev. Lett. 81, 5892 (1998).
- R. M. Marsolais, M. Deschenes, and L. Sanche, Rev. Sci. Instrum. 60, 2724 (1989).
- J. N. Bardsley,
Rep. Prog. Phys. 31, 471 (1968) . - T. Martin, R. Bruinsma, and P. M. Platzman, Phys. Rev. B 38, 2257 (1988).
- D. P. Clougherty and W. Kohn, Phys. Rev. B 46, 4921 (1992).
- W. Kohn,
Surf. Rev. Lett. 1, 129 (1994) . - W. Shockley,
Phys. Rev. 56, 317 (1939) . - M. W. Cole and M. H. Cohen,
Phys. Rev. Lett. 23, 1238 (1969) . - C. C. Grimes and G. Adams, Phys. Rev. Lett. 42, 795 (1979).
- E. Abrahams, S. V. Kravchenko, and M. P. Sarachik, Rev. Mod. Phys. 73, 251 (2001).
- M. Pope and C.E. Swenberg, Electronic Processes in Organic Crystals and Polymers, 2nd ed. (Oxford, New York, 1999), p. 347.
- T. Koshikawa, R. Shimizu et al.,
J. Phys. D 7, 462 (1974) . - R. Kollath,
Ann. Phys. 33, 285 (1938) . - In Eq. (2) we have set µ(E)=
(E)
(EaE) (with Ea
0.5 eV), s(E)=E4e2E/Ep (with Ep
0.8 eV), and 1/
=0.32 s (see Table I, second line). - D. Straub and F. J. Himpsel, Phys. Rev. B 33, 2256 (1986).
- F. J. Himpsel, Phys. Rev. B 43, 13394 (1991).
- M. W. Cole,
Phys. Rev. B 2, 4239 (1970) .







