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Low symmetry phase in (001) BiFeO3 epitaxial constrained thin films

Appl. Phys. Lett. 86, 182905 (2005); doi:10.1063/1.1924891

Published 28 April 2005

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Guangyong Xu, H. Hiraka, and G. Shirane
Physics Department, Brookhaven National Laboratory, Upton, New York 11973

Jiefang Li, Junling Wang, and D. Viehland
Department of Materials Science and Engineering, Virginia Tech, Blacksburg, Virginia 24061
The lattice of (001)-oriented BiFeO3 epitaxial thin film has been identified by synchrotron x-ray diffraction. By choosing proper scattering zones containing the fixed (001) reflection, we have shown that low-symmetry phases similar to a MA phase exist in the thin film at room temperature. These results demonstrate a change in phase stability from rhombohedral in bulk single crystals, to a modified monoclinic structure in epitaxial thin films. ©2005 American Institute of Physics
History: Received 20 December 2004; accepted 4 April 2005; published 28 April 2005
Permalink: http://link.aip.org/link/?APPLAB/86/182905/1
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KEYWORDS and PACS

Keywords
PACS
  • 77.84.Bw
    Dielectric, piezoelectric, and ferroelectric elements, oxides, nitrides, borides, carbides, chalcogenides, etc.
  • 77.55.+f
    Dielectric thin films
  • 75.50.Ee
    Antiferromagnetics
  • 68.55.Jk
    Thin film structure and morphology; thickness; crystalline orientation and texture
  • 61.66.Fn
    Crystal structure of specific inorganic compounds
  • 77.80.-e
    Ferroelectricity and antiferroelectricity
  • YEAR: 2005

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PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
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