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Low-temperature high-resolution magnetic force microscopy using a quartz tuning fork

Appl. Phys. Lett. 87, 103103 (2005); doi:10.1063/1.2037852

Published 29 August 2005

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Yongho Seo, Paul Cadden-Zimansky, and Venkat Chandrasekhar
Department of Physics and Astronomy, Northwestern University, Evanston, Illinois 60208
We have developed a low-temperature high resolution magnetic force microscope (MFM) using a quartz tuning fork that can operate in a magnetic field. A tuning fork with a spring constant of 1300  N/m mounted with a commercial MFM cantilever tip was used. We have obtained high-resolution images of the stray magnetic fields exerted from grains with a spatial resolution of 15 nm and force resolution of 2 pN at 4.2 K. Tuning fork-based magnetic force microscopes have the potential to be used at millikelvin temperatures due to their low power dissipation and high force sensitivity. ©2005 American Institute of Physics
History: Received 21 April 2005; accepted 13 July 2005; published 29 August 2005
Permalink: http://link.aip.org/link/?APPLAB/87/103103/1
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KEYWORDS and PACS

Keywords
PACS
  • 07.79.Pk
    Magnetic force microscopes
  • YEAR: 2005

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ISSN:
0003-6951 (print)   1077-3118 (online)
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