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Technique to measure sub-microsecond magnetic field pulses using magnetic (CoPt) thin films

Appl. Phys. Lett. 87, 182505 (2005); doi:10.1063/1.2126109

Published 27 October 2005

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W. Syed
Laboratory of Plasma Studies, Cornell University, Ithaca, New York 14853

R. B. van Dover and J. R. Petrie
Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853

M. D. Mitchell and D. A. Hammer
Laboratory of Plasma Studies, Cornell University, Ithaca, New York 14853
We introduce a technique to measure the maximum magnetic field of a submicrosecond duration pulse using magnetic CoPt thin films. In the present experiment, this technique yields a lower limit for the field intensity and reveals the sense of that peak field. The time-varying magnetic field was generated by an exploding wire array plasma called an X pinch. Using a Quantum Design Superconducting Quantum Interference Device magnetometer, two thin films were initialized with remnant magnetization along a specific direction. The two films were then placed near an X-pinch plasma column with magnetizations in opposite directions. The current driven through the X pinch induced a change in magnetization in the films, which implied a lower bound of 17 kOe for the magnitude of the maximum magnetic field to which the film was exposed. ©2005 American Institute of Physics
History: Received 18 May 2005; accepted 12 September 2005; published 27 October 2005
Permalink: http://link.aip.org/link/?APPLAB/87/182505/1
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KEYWORDS and PACS

Keywords
PACS
  • 07.55.Ge
    Magnetometers for magnetic field measurements
  • 75.70.Ak
    Magnetic properties of monolayers and thin films
  • 75.60.Ej
    Magnetization curves, hysteresis, Barkhausen and related effects
  • YEAR: 2005

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PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
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