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Optical study of hot electron transport in GaN: Signatures of the hot-phonon effect

Appl. Phys. Lett. 88, 022103 (2006); doi:10.1063/1.2163709

Published 9 January 2006

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Kejia Wang, John Simon, Niti Goel, and Debdeep Jena
Department of Electrical Engineering, University of Notre Dame, Notre Dame, Indiana 46556
The hot-phonon lifetime in GaN is measured by temperature- and electric field-dependent photoluminescence studies of a n-type channel. The rate of increase of electron temperature with the external electric field provides a signature of nonquilibrium hot-phonon accumulation. Hot-electron temperatures are measured directly as a function of applied electric fields, and by comparing theoretical models for electron energy-loss into acoustic and optical phonons, a hot-phonon lifetime of tauph=3 to 4 ps is extracted. ©2006 American Institute of Physics
History: Received 21 September 2005; revised 12 December 2005; accepted 13 December 2005; published 9 January 2006
Permalink: http://link.aip.org/link/?APPLAB/88/022103/1
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KEYWORDS and PACS

Keywords
PACS
  • 72.20.Ht
    High-field transport and nonlinear effects (semiconductors/insulators)
  • 78.55.Cr
    Photoluminescence in III–V semiconductors
  • 63.20.-e
    Phonons in crystal lattices
  • 61.85.+p
    Channeling phenomena including blocking, energy loss, etc
  • YEAR: 2006

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ISSN:
0003-6951 (print)   1077-3118 (online)
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