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Microparticle manipulation using inertial forces

Appl. Phys. Lett. 88, 091913 (2006); doi:10.1063/1.2172401

Published 2 March 2006

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Michael Eglin
Department of Engineering Physics, University of Wisconsin, Madison, Wisconsin 53706

Mark A. Eriksson
Department of Physics, University of Wisconsin, Madison, Wisconsin 53706

Robert W. Carpick
Department of Engineering Physics, University of Wisconsin, Madison, Wisconsin 53706
We demonstrate controlled manipulation of large quantities of microparticles on a surface using inertial forces. Motion is induced by applying a periodic parabolic wave form to a shear-polarized piezoelectric plate coupled to a substrate on which the particles reside. Particles move in steps of 10 to 50 nm per cycle, and the particle motion is mass selective. Particle velocity is varied by changing the frequency of the wave form. Calculated inertial forces acting on the particles correspond closely to friction forces between individual microparticles and the substrate, as measured by coupling an individual particle to an atomic force microscope. The results provide insight into the characteristics of particle-surface interactions, and demonstrate the potential for controlled manipulation and separation of large collections of particles without the need for a fluid medium. ©2006 American Institute of Physics
History: Received 1 July 2005; accepted 19 December 2005; published 2 March 2006
Permalink: http://link.aip.org/link/?APPLAB/88/091913/1
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Supplemental Material

KEYWORDS and PACS

Keywords
PACS
  • 81.16.Ta
    Atom manipulation in nanofabrication and processing
  • YEAR: 2006

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PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
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REFERENCES (15)
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  10. See EPAPS Document No. E-APPLAB-88-041606 (http://ftp.aip.org/cgi-bin/epaps? ID=E-APPLAB-88-041606) for a movie showing two dimensional particle manipulation. For more information on EPAPS, See http://www.aip.org/pubserves/epaps.html [EPAPS]
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