Spatial imaging and mechanical control of spin coherence in strained GaAs epilayers
Appl. Phys. Lett. 88, 241918 (2006); doi:10.1063/1.2210794
Published 14 June 2006
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The effect of uniaxial tensile strain on spin coherence in n-type GaAs epilayers is probed using time-resolved Kerr rotation, photoluminescence, and optically detected nuclear magnetic resonance spectroscopies. The band gap, electron spin lifetime, electron g factor, and nuclear quadrupole splitting are simultaneously imaged over millimeter scale areas of the epilayers for continuously varying values of strain. All-optical nuclear magnetic resonance techniques allow access to the strain-induced nuclear quadrupolar resonance splitting in field regimes not easily addressable using conventional optically detected nuclear magnetic resonance.
©2006 American Institute of Physics
| History: | Received 22 November 2005; accepted 27 April 2006; published 14 June 2006 |
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http://link.aip.org/link/?APPLAB/88/241918/1 |
KEYWORDS and PACS
gallium arsenide,
III-V semiconductors,
semiconductor epitaxial layers,
time resolved spectra,
optical Kerr effect,
photoluminescence,
nuclear magnetic resonance,
energy gap,
g-factor,
quadrupole interactions,
internal stresses
- 68.60.Bs
Mechanical and acoustical properties of thin films - 78.55.Cr
Photoluminescence in IIIV semiconductors - 78.66.Fd
Optical properties of IIIV semiconductors (thin films) - 78.47.+p
Time-resolved optical spectroscopies and other ultrafast optical measurements in condensed matter - 76.60.-k
Nuclear magnetic resonance and relaxation (condensed matter) - 71.18.+y
Fermi surface: calculations and measurements; effective mass, -g factor - YEAR: 2006
RELATED DATABASES
PUBLICATION DATA
0003-6951 (print)
1077-3118 (online)
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