Inserting one single Mn ion into a quantum dot
A method of growth to get one single Mn in self-assembled semiconductor quantum dot is presented. With a simple quantitative model, the appropriate low Mn density needed prior to the quantum dot nucle...
A method of growth to get one single Mn in self-assembled semiconductor quantum dot is presented. With a simple quantitative model, the appropriate low Mn density needed prior to the quantum dot nucle...
Growth control of tungsten oxide nanostructures on planar silicon substrates
Tungsten oxide nanostructures were deposited on silicon substrates by a thermal oxidation approach. The major factors influencing their phase structure and growth morphology were found to be the subst...
Tungsten oxide nanostructures were deposited on silicon substrates by a thermal oxidation approach. The major factors influencing their phase structure and growth morphology were found to be the subst...
In situ experimental study of a near-field lens at visible frequencies
Appl. Phys. Lett. 89, 193110 (2006); doi:10.1063/1.2387871
Published 8 November 2006
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Frequency dependent near-field scanning optical microscopy (NSOM) measurements of plasmon-mediated near-field focusing using a 50 nm thick Au film are presented. In these studies the tip aperture of a NSOM probe acts as a localized light source, while the near-field image formed by the metal lens is detected in situ using nanoscale scatterers placed in the image plane. By scanning the relative position of object and probe, the near-field image generated by the lens is resolved. NSOM scans performed at different illumination frequencies reveal an optimum near-field image quality at frequencies close to the surface plasmon resonance frequency.
©2006 American Institute of Physics
| History: | Received 18 May 2006; accepted 26 September 2006; published 8 November 2006 |
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http://link.aip.org/link/?APPLAB/89/193110/1 |
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