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Measurement of silicon dioxide surface phonon-polariton propagation length by attenuated total reflection

Appl. Phys. Lett. 91, 121906 (2007); doi:10.1063/1.2789177

Published 19 September 2007

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Dye-Zone A. Chen and Gang Chen
Department of Mechanical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, USA
The authors present an experimental measurement of the propagation length of surface phonon-polaritons on amorphous silicon dioxide using the method of attenuated total reflection. The measurements yield a propagation length of 10.8±1.3  µm for the silicon dioxide surface phonon-polariton resonance at 9  µm, which is in good agreement with the calculated value. ©2007 American Institute of Physics
History: Received 24 May 2007; accepted 3 September 2007; published 19 September 2007
Permalink: http://link.aip.org/link/?APPLAB/91/121906/1
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KEYWORDS and PACS

Keywords
PACS
  • 78.68.+m
    Optical properties of surfaces
  • 68.35.Ja
    Solid surface and interface dynamics and vibrations
  • 71.36.+c
    Polaritons including photon–phonon and photon–magnon interactions
  • YEAR: 2007

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PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
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