Applied Physics Letters
Feedback | Help | Exit
Applied Physics Letters
   
 
 
 
Previous Article
New analysis of electron energy exchange and cooling in semiconductors
Energy exchange is investigated in field emission from semiconductors. For the first time, a formal theory is developed for the replacement process of the injected charge carriers. It leads to analyt...
Next Article
Characterization of electrical and structural properties of strained-Si-on-insulator layers
The electrical and structural properties of strained-Si-on-insulator (sSOI) wafers were investigated. The strain, calculated from two-dimensional reciprocal space mapping, was found to be 0.78%, which...

High temperature resistance of small diameter, metallic single-walled carbon nanotube devices

Appl. Phys. Lett. 92, 083506 (2008); doi:10.1063/1.2885092

Published 28 February 2008

You are not logged in to this journal. Log in

Alexander A. Kane, Kevin Loutherback, Brett R. Goldsmith, and Philip G. Collins
Department of Physics and Astronomy, University of California, Irvine, California 92697-4576, USA
The effects of high temperature cycling on the resistance of metallic single-walled carbon nanotube (SWCNT) devices is measured in situ. Individual, small-diameter SWCNTs contacted by palladium or titanium electrodes were measured from room temperature up to 1000  K in ultrahigh vacuum. Upon the first thermal cycling, the device resistances fluctuate and generally decrease. Pd-contacted devices typically become stable by 450  K, whereas Ti-contacted devices require higher treatments above 600  K. Once these temperatures have been exceeded, subsequent thermal cycling has minimal effects. Heat-treated devices exhibit linear temperature dependences, with Pd and Ti contacts producing average temperature coefficients of −3×10−4/K and 1.1×10−3/K, respectively. ©2008 American Institute of Physics
History: Received 9 November 2007; accepted 26 January 2008; published 28 February 2008
Permalink: http://link.aip.org/link/?APPLAB/92/083506/1
BUY THIS ARTICLE   (US$28)
Download HTML Download Sectioned HTML Download PDF (281 kB) View Cart

KEYWORDS and PACS

Keywords
PACS
  • 85.35.Kt
    Nanotube devices
  • 73.40.Cg
    Contact resistance, contact potential
  • 81.40.Gh
    Other heat and thermomechanical treatments
  • YEAR: 2008

RELATED DATABASES


To view database links for this article,
you need to log in.
To view database links for this article,
you need to log in.

PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (26)
View in Separate Window/Tab
For access to fully linked references, you need to log in. For access to fully linked references, you need to Log in.
  1. W. Liang, M. Bockrath, D. Bozovic, J. H. Hafner, M. Tinkham, and P. Hongkun, Nature (London) 411, 665 (2001).
  2. D. Mann, A. Javey, J. Kong, Q. Wang, and H. J. Dai, Nano Lett. 3, 1541 (2003).
  3. Z. Chen, J. Appenzeller, J. Knoch, Y. Lim, and P. Avouris, Nano Lett. 5, 1497 (2005).
  4. W. Kim, A. Javey, R. Tu, J. Cao, Q. Wang, and H. Dai, Appl. Phys. Lett. 87, 173101 (2005).
  5. J. J. Palacios, A. J. Perez-Jimenez, E. Louis, E. San Fabian, and J. A. Verges, Phys. Rev. Lett. 90, 106801 (2003).
  6. S. H. Ke, W. T. Yang, and H. U. Baranger, J. Chem. Phys. 124, 181102 (2006).
  7. W. Zhu and E. Kaxiras, Nano Lett. 6, 1415 (2006).
  8. Y. Matsuda, W. Q. Deng, and W. A. Goddard, J. Phys. Chem. C 111, 11113 (2007).
  9. S. Heinze, J. Tersoff, and P. Avouris, in Introducing Molecular Electronics, edited by G. Cuniberti (Springer, Berlin, 2005), Vol. 680.
  10. H. Dai, A. Javey, E. Pop, D. Mann, W. Kim, and Y. Lu, NANO 1, 1 (2006).
  11. J. Guo, S. Datta, and M. Lundstrom, IEEE Trans. Electron Devices 51, 172 (2004).
  12. K. Bradley, S. H. Jhi, P. G. Collins, J. Hone, M. L. Cohen, S. G. Louie, and A. Zettl, Phys. Rev. Lett. 85, 4361 (2000).
  13. V. Derycke, R. Martel, J. Appenzeller, and P. Avouris, Appl. Phys. Lett. 80, 2773 (2002).
  14. S. Rosenblatt, Y. Yaish, J. Park, J. Gore, V. Sazonova, and P. L. McEuen, Nano Lett. 2, 869 (2002).
  15. W. Yunsung, G. Duesberg, and S. Roth, Nanotechnology 18, 095203 (2007).
  16. D. Lifeng and R. Chebiam, J. Appl. Phys. 101, 024320 (2007).
  17. A. Bachtold, M. Henny, C. Tarrier, C. Strunk, C. Schonenberger, J. P. Salvetat, J. M. Bonard, and L. Forro, Appl. Phys. Lett. 73, 274 (1998).
  18. A. C. Dillon, T. Gennett, K. M. Jones, J. L. Alleman, P. A. Parilla, and M. J. Heben, Adv. Mater. (Weinheim, Ger.) V11, 1354 (1999).
  19. M. S. Dresselhaus and M. Endo, in Carbon Nanotubes: Synthesis, Structure, Properties and Applications, edited by M. S. Dresselhaus, G. Dresselhaus, and P. Avouris (Springer, Berlin, 2001), p. 11.
  20. L. An, J. M. Owens, L. E. McNeil, and J. Liu, J. Am. Chem. Soc. 124, 13688 (2002).
  21. S. M. Huang, B. Maynor, X. Y. Cai, and J. Liu, Adv. Mater. (Weinheim, Ger.) 15, 1651 (2003).
  22. B. R. Goldsmith, J. G. Coroneus, V. R. Khalap, A. A. Kane, G. A. Weiss, and P. G. Collins, Science 315, 77 (2007).
  23. Following a 15  min 200  °C prebake on a hotplate, LOR 1A (MicroChem) was spun on at 4000  rpm with a postbake hotplate temperature of 190  °C for 5  min. Shipley 1808 was spun on on top of the LOR at 4000  rpm and softbaked at 90  °C for 30  min in a convection oven.
  24. M. Di Ventra and T. N. Todorov, J. Phys.: Condens. Matter 16, 8025 (2004).
  25. CRC Handbook of Chemistry and Physics, edited by D. R. Lide (Taylor and Francis, London, 2007).
  26. Y. Imry and R. Landaur, Rev. Mod. Phys. 71, S306 (1999).

CITING ARTICLES
For access to citing articles, you need to log in.
For access to citing articles, you need to Log in.


Copyright © American Institute of Physics