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Measuring current by counting electrons in a nanowire quantum dot

Appl. Phys. Lett. 92, 152101 (2008); doi:10.1063/1.2892679

Published 14 April 2008

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S. Gustavsson, I. Shorubalko, R. Leturcq, S. Schön, and K. Ensslin
Solid State Physics Laboratory, ETH Zürich, CH-8093 Zürich, Switzerland
We measure current by counting single electrons tunneling through an InAs nanowire quantum dot (QD). The charge detector is realized by fabricating a quantum point contact in close vicinity to the nanowire. The results based on electron counting compare well to a direct measurements of the QD current, when taking the finite bandwidth of the detector into account. The ability to detect single electrons also opens up possibilities for manipulating and detecting individual spins in nanowire QDs. ©2008 American Institute of Physics
History: Received 22 December 2007; accepted 14 February 2008; published 14 April 2008
Permalink: http://link.aip.org/link/?APPLAB/92/152101/1
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KEYWORDS and PACS

Keywords
PACS
  • 72.80.Ey
    Electrical conductivity of III-V and II-VI semiconductors
  • 73.21.Hb
    Quantum wires (electron states/collective excitations)
  • 73.21.La
    Quantum dots (electron states/collective excitations)
  • 73.40.Gk
    Tunneling (electronic transport)
  • YEAR: 2008

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ISSN:
0003-6951 (print)   1077-3118 (online)
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REFERENCES (21)
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  1. J. R. Petta, A. C. Johnson, C. M. Marcus, M. P. Hanson, and A. C. Gossard, Phys. Rev. Lett. 93, 186802 (2004).
  2. W. Lu, Z. Ji, L. Pfeiffer, K. W. West, and A. J. Rimberg, Nature (London) 423, 422 (2003).
  3. S. Gustavsson, R. Leturcq, B. Simovic, R. Schleser, T. Ihn, P. Studerus, K. Ensslin, D. C. Driscoll, and A. C. Gossard, Phys. Rev. Lett. 96, 076605 (2006).
  4. T. Fujisawa, T. Hayashi, R. Tomita, and Y. Hirayama, Science 312, 1634 (2006).
  5. J. M. Elzerman, R. Hanson, L. H. Willems van Beveren, B. Witkamp, L. M. K. Vandersypen, and L. P. Kouwenhoven, Nature (London) 430, 431 (2004).
  6. J. R. Petta, A. C. Johnson, J. M. Taylor, E. A. Laird, A. Yacoby, M. D. Lukin, C. M. Marcus, M. P. Hanson, and A. C. Gossard, Science 309, 2180 (2005).
  7. J. Bylander, T. Duty, and P. Delsing, Nature (London) 434, 361 (2005).
  8. S. Gustavsson, M. Studer, R. Leturcq, T. Ihn, K. Ensslin, D. C. Driscoll, and A. C. Gossard, Phys. Rev. Lett. 99, 206804 (2007).
  9. O. Naaman and J. Aumentado, Phys. Rev. Lett. 96, 100201 (2006).
  10. A. Pfund, I. Shorubalko, R. Leturcq, M. T. Borgström, F. Gramm, E. Müller, and K. Ensslin, Chimia 60, A729 (2006).
  11. I. Shorubalko, R. Leturcq, A. Pfund, D. Tyndall, R. Krischek, S. Schön, and K. Ensslin, Nano Lett. 8, 382 (2008).
  12. M. Field, C. G. Smith, M. Pepper, D. A. Ritchie, J. E. F. Frost, G. A. C. Jones, and D. G. Hasko, Phys. Rev. Lett. 70, 1311 (1993).
  13. R. Schleser, E. Ruh, T. Ihn, K. Ensslin, D. C. Driscoll, and A. C. Gossard, Appl. Phys. Lett. 85, 2005 (2004).
  14. L. M. K. Vandersypen, J. M. Elzerman, R. N. Schouten, L. H. Willems van Beveren, R. Hanson, and L. P. Kouwenhoven, Appl. Phys. Lett. 85, 4394 (2004).
  15. T. Fujisawa, T. Hayashi, Y. Hirayama, H. D. Cheong, and Y. H. Jeong, Appl. Phys. Lett. 84, 2343 (2004).
  16. D. J. Reilly, C. M. Marcus, M. P. Hanson, and A. C. Gossard, Appl. Phys. Lett. 91, 162101 (2007).
  17. I. T. Vink, T. Nooitgedagt, R. N. Schouten, L. M. K. Vandersypen, and W. Wegscheider, Appl. Phys. Lett. 91, 123512 (2007).
  18. T. Müller, K. Vollenweider, T. Ihn, R. Schleser, M. Sigrist, K. Ensslin, M. Reinwald, and W. Wegscheider, AIP Conf. Proc. 893, 1113 (2007).
  19. M. C. Cassidy, A. S. Dzurak, R. G. Clark, K. D. Petersson, I. Farrer, D. A. Ritchie, and C. G. Smith, Appl. Phys. Lett. 91, 222104 (2007).
  20. S. Gustavsson, R. Leturcq, B. Simovic, R. Schleser, P. Studerus, T. Ihn, K. Ensslin, D. C. Driscoll, and A. C. Gossard, Phys. Rev. B 74, 195305 (2006).
  21. S. Gustavsson, R. Leturcq, T. Ihn, K. Ensslin, M. Reinwald, and W. Wegscheider, Phys. Rev. B 75, 075314 (2007).

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