Applied Physics Letters
Feedback | Help | Exit
Applied Physics Letters
   
 
 
 
Previous Article
Enhancement in microwave modulation efficiency of vertical cavity surface-emitting laser by optical feedback
We investigate a versatile vertical cavity surface-emitting laser (VCSEL) with a slight optical feedback from a simple wedge positioned at a well determined distance from the VCSEL. We use such a lase...
Next Article
High rate reactive magnetron sputter deposition of titanium oxide
A systematic experimental study of reactive sputtering from substoichiometric targets of TiOx with x ranging from 0 to 1.75 is reported. Experimental results are compared with results from modeling. T...

Focusing of hard x-rays to 16 nanometers with a multilayer Laue lens

Appl. Phys. Lett. 92, 221114 (2008); doi:10.1063/1.2912503

Published 6 June 2008

You are not logged in to this journal. Log in

Hyon Chol Kang,1 Hanfei Yan,1 Robert P. Winarski,1 Martin V. Holt,1 Jörg Maser,1 Chian Liu,2 Ray Conley,2 Stefan Vogt,2 Albert T. Macrander,2 and G. Brian Stephenson3
1Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439, USA
2X-ray Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
3Materials Science Division and Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439, USA
We report improved results for hard x-ray focusing using a multilayer Laue lens (MLL). We have measured a line focus of 16  nm width with an efficiency of 31% at a wavelength lambda=0.064  nm (19.5  keV) using a partial MLL structure with an outermost zone width of 5  nm. The results are in good agreement with the theoretically predicted performance. ©2008 American Institute of Physics
History: Received 9 January 2008; accepted 1 April 2008; published 6 June 2008
Permalink: http://link.aip.org/link/?APPLAB/92/221114/1
BUY THIS ARTICLE   (US$28)
Download HTML Download Sectioned HTML Download PDF (450 kB) View Cart

KEYWORDS and PACS

Keywords
PACS
  • 07.85.-m
    X- and γ-ray instruments
  • YEAR: 2008

RELATED DATABASES


To view database links for this article,
you need to log in.
To view database links for this article,
you need to log in.

PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (21)
View in Separate Window/Tab
For access to fully linked references, you need to log in. For access to fully linked references, you need to Log in.
  1. G.-C. Yin, Y.-F. Song, M.-T. Tang, F.-R. Chen, K. S. Liang, F. W. Duewer, M. Feser, W. Yun, and H.-P. D. Shieh, Appl. Phys. Lett. 89, 221122 (2006).
  2. C. Bergemann, H. Keymeulen, and J. F. van der Veen, Phys. Rev. Lett. 91, 204801 (2003).
  3. H. Mimura, H. Yumoto, S. Matsuyama, Y. Sano, K. Yamamura, Y. Mori, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, and K. Yamauchi, Appl. Phys. Lett. 90, 051903 (2007).
  4. O. Hignette, P. Cloetens, G. Rostaing, P. Bernard, and C. Morawe, Rev. Sci. Instrum. 76, 063709 (2005).
  5. H. Yumoto, H. Mimura, S. Matsuyama, S. Handa, Y. Sano, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, and K. Yamauchi, Rev. Sci. Instrum. 77, 063712 (2006).
  6. C. G. Schroer and B. Lengeler, Phys. Rev. Lett. 94, 054802 (2005).
  7. C. G. Schroer, O. Kurapova, J. Patommel, P. Boye, J. Feldkamp, B. Lengeler, M. Burghammer, C. Riekel, L. Vincze, A. van der Hart, and M. Küchler, Appl. Phys. Lett. 87, 124103 (2005).
  8. M. J. Zwanenburg, J. H. H. Bongaerts, J. F. Peters, D. Riese, and J. F. van der Veen, Physica B 283, 285 (2000).
  9. H. C. Kang, J. Maser, G. B. Stephenson, C. Liu, R. Conley, A. T. Macrander, and S. Vogt, Phys. Rev. Lett. 96, 127401 (2006).
  10. C. Liu, R. Conley, A. T. Macrander, J. Maser, H. C. Kang, M. A. Zurbuchen, and G. B. Stephenson, J. Appl. Phys. 98, 113519 (2005).
  11. J. Kirz, J. Opt. Soc. Am. 64, 301 (1974).
  12. Y.-P. Wang, H. Zhou, L. Zhou, R. L. Headrick, A. T. Macrander, and A. S. Özcan, J. Appl. Phys. 101, 023503 (2007).
  13. C. Liu, R. Conley, and A. T. Macrander, Proc. SPIE 6317, 63170J (2006).
  14. H. C. Kang, G. B. Stephenson, C. Liu, R. Conley, R. Khachatryan, M. Wieczorek, A. T. Macrander, H. Yan, J. Maser, J. Hiller, and R. Koritala, Rev. Sci. Instrum. 78, 046103 (2007).
  15. H. Yan, J. Maser, A. Macrander, Q. Shen, S. Vogt, G. B. Stephenson, and H. C. Kang, Phys. Rev. B 76, 115438 (2007).
  16. A. Authier, Dynamical Theory of X-ray Diffraction (Oxford University Press, Oxford, 2002).
  17. J. Maser and G. Schmahl, Opt. Commun. 89, 355 (1992).
  18. C. G. Schroer, Phys. Rev. B 74, 033405 (2006).
  19. F. Pfeiffer, C. David, J. F. van der Veen, and C. Bergemann, Phys. Rev. B 73, 245331 (2006).
  20. X-rays and Neutrons: Essential Tools for Nanoscience Research, NNI Workshop, Washington, DC, June 16–18, 2005 (unpublished).
  21. S. Dierker et al., Brookhaven National Laboratory, NSLS II Conceptual Design Report.

CITING ARTICLES
For access to citing articles, you need to log in.
For access to citing articles, you need to Log in.


Copyright © American Institute of Physics