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Rapid multidimensional data acquisition in scanning probe microscopy applied to local polarization dynamics and voltage dependent contact mechanics

Appl. Phys. Lett. 93, 112903 (2008); doi:10.1063/1.2980031

Published 15 September 2008

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Stephen Jesse, Peter Maksymovych, and Sergei V. Kalinin
The Center for Nanophase Materials Science and Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
A rapid multidimensional spectroscopic imaging approach in scanning probe microscopy is developed and applied to piezoresponse force spectroscopy. Evolution of resonance frequency, dissipation, and piezoresponse signal at each point during acquisition of local hysteresis loops provides information on polarization dynamics and voltage dependent contact mechanics of ferroelectric surfaces. The measurements illustrate significant frequency shifts during piezoresponse force spectroscopy, necessitating the use of frequency-tracking methods. The method is universal and can be extended to other scanning probe microscopy techniques. ©2008 American Institute of Physics
History: Received 17 March 2008; accepted 20 August 2008; published 15 September 2008
Permalink: http://link.aip.org/link/?APPLAB/93/112903/1
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KEYWORDS and PACS

Keywords
PACS
  • 77.84.Dy
    Dielectric, piezoelectric, and ferroelectric niobates, titanates, tantalates, PZT ceramics, etc
  • 77.22.Ej
    Dielectric polarization and depolarization
  • 77.80.Dj
    Ferroelectric domain structure; hysteresis
  • 77.80.Fm
    Ferroelectric switching phenomena
  • 77.65.Bn
    Piezoelectric and electrostrictive constants
  • YEAR: 2008

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PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
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REFERENCES (16)
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