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Measuring far-ultraviolet whispering gallery modes with high energy electrons

Appl. Phys. Lett. 93, 243106 (2008); doi:10.1063/1.3046731

Published 15 December 2008

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J. K. Hyun,1 M. Couillard,2 P. Rajendran,3 C. M. Liddell,3 and D. A. Muller2
1Department of Physics, Cornell University, Ithaca, New York 14853, USA
2Department of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA
3Department of Material Science and Engineering, Cornell University, Ithaca, New York 14853, USA
Dielectric nanospheres are important components for photonic applications, where interactions between whispering gallery modes (WGMs) can be used to construct photonic band structures. Using the electromagnetic fields generated by relativistic electrons in a monochromated 200 keV scanning transmission electron microscope, we record electron energy loss spectral features reflecting the density of states (DOS) of the electric-type WGMs in SiO2 nanospheres over an energy range extending into the far-ultraviolet regime. These results demonstrate possibilities for mapping the local DOS of photonic systems in an electron microscope with a spatial resolution of a few nanometers. ©2008 American Institute of Physics
History: Received 13 September 2008; accepted 5 November 2008; published 15 December 2008
Permalink: http://link.aip.org/link/?APPLAB/93/243106/1
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KEYWORDS and PACS

Keywords
PACS
  • 61.46.-w
    Structure of nanoscale materials
  • 77.22.Ch
    Permittivity (dielectric function)
  • 42.70.Qs
    Photonic bandgap materials
  • 77.84.Bw
    Dielectric, piezoelectric, and ferroelectric elements, oxides, nitrides, borides, carbides, chalcogenides, etc
  • 79.20.Uv
    Electron energy loss spectroscopy
  • 73.22.-f
    Electronic structure of nanoscale materials
  • YEAR: 2008

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PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
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