Dynamics of single vortices in grain boundaries: I-V characteristics on the femtovolt scale
Appl. Phys. Lett. 94, 202504 (2009); doi:10.1063/1.3137164
Published 19 May 2009
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We employed a scanning Hall probe microscope to detect the hopping of individual vortices between pinning sites along grain boundaries in YBa2Cu3O6+
thin films in the presence of an applied current. Detecting the motion of individual vortices allowed us to probe the current-voltage (I-V) characteristics of the grain boundary with voltage sensitivity below a femtovolt. We find a very sharp onset of dissipation with V
In with an unprecedented high exponent of n
290 that shows essentially no dependence on temperature or grain boundary angle. Our data have no straightforward explanation within the existing grain boundary transport models.
©2009 American Institute of Physics
thin films in the presence of an applied current. Detecting the motion of individual vortices allowed us to probe the current-voltage (I-V) characteristics of the grain boundary with voltage sensitivity below a femtovolt. We find a very sharp onset of dissipation with V
In with an unprecedented high exponent of n
290 that shows essentially no dependence on temperature or grain boundary angle. Our data have no straightforward explanation within the existing grain boundary transport models.
©2009 American Institute of Physics
| History: | Received 18 March 2009; accepted 24 April 2009; published 19 May 2009 |
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http://link.aip.org/link/?APPLAB/94/202504/1 |
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0003-6951 (print)
1077-3118 (online)
REFERENCES (24)
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