Molecular beam epitaxy of SrTiO3 with a growth window
Appl. Phys. Lett. 95, 032906 (2009); doi:10.1063/1.3184767
Published 23 July 2009
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Many complex oxides with only nonvolatile constituents do not have a wide growth window in conventional molecular beam epitaxy (MBE) approaches, which makes it difficult to obtain stoichiometric films. Here it is shown that a growth window in which the stoichiometry is self-regulating can be achieved for SrTiO3 films by using a hybrid MBE approach that uses a volatile metal-organic source for Ti, titanium tetra isopropoxide (TTIP). The growth window widens and shifts to higher TTIP/Sr flux ratios with increasing temperature, showing that it is related to the desorption of the volatile TTIP. We demonstrate stoichiometric, highly perfect, insulating SrTiO3 films. The approach can be adapted for the growth of other complex oxides that previously were believed to have no wide MBE growth window.
©2009 American Institute of Physics
| History: | Received 22 June 2009; accepted 29 June 2009; published 23 July 2009 |
| Permalink: |
http://link.aip.org/link/?APPLAB/95/032906/1 |
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REFERENCES (21)
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- M. D. Biegalski, D. D. Fong, J. A. Eastman, P. H. Fuoss, S. K. Streiffer, T. Heeg, J. Schubert, W. Tian, C. T. Nelson, X. Q. Pan, M. E. Hawley, M. Bernhagen, P. Reiche, R. Uecker, S. Trolier-McKinstry, and D. G. Schlom, J. Appl. Phys. 104, 114109 (2008).
- D. G. Schlom, J. H. Haeni, J. Lettieri, C. D. Theis, W. Tian, J. C. Jiang, and X. Q. Pan,
Mater. Sci. Eng. B 87, 282 (2001) . - D. D. Berkley, B. R. Johnson, N. Anand, K. M. Beauchamp, L. E. Conroy, A. M. Goldman, J. Maps, K. Mauersberger, M. L. Mecartney, J. Morton, M. Tuominen, and Y. J. Zhang, Appl. Phys. Lett. 53, 1973 (1988).
- B. Jalan, R. Engel-Herbert, J. Cagnon, and S. Stemmer,
J. Vac. Sci. Technol. A 27, 230 (2009) . - J. Y. Tsao, Materials Fundamentals of Molecular Beam Epitaxy (Academic, Boston, 1993).
- C. D. Theis, J. Yeh, D. G. Schlom, M. E. Hawley, and G. W. Brown,
Thin Solid Films 325, 107 (1998) . - S. Migita, Y. Kasai, and S. Sakai,
J. Low Temp. Phys. 105, 1337 (1996) . - M. E. Klausmeier-Brown, J. N. Eckstein, I. Bozovic, and G. F. Virshup, Appl. Phys. Lett. 60, 657 (1992).
- J. H. Haeni, C. D. Theis, and D. G. Schlom,
J. Electroceram. 4, 385 (2000) . - B. Jalan, R. Engel-Herbert, N. J. Wright, and S. Stemmer,
J. Vac. Sci. Technol. A 27, 461 (2009) . - K. L. Siefering and G. L. Griffin,
J. Electrochem. Soc. 137, 1206 (1990) . - P. D. Desai,
Int. J. Thermophys. 8, 781 (1987) . - C. J. Taylor, D. C. Gilmer, D. G. Colombo, G. D. Wilk, S. A. Campbell, J. Roberts, and W. L. Gladfelter,
J. Am. Chem. Soc. 121, 5220 (1999) . - K. -H. Ahn, Y. -B. Park, and D. -W. Park,
Surf. Coat. Technol. 171, 198 (2002) . - F. G. Celii, Y. C. Kao, E. A. Beam, W. M. Duncan, and T. S. Moise,
J. Vac. Sci. Technol. B 11, 1018 (1993) . - See EPAPS supplementary material at http://dx.doi.org/10.1063/1.3184767 for further information about the structural quality of the films, growth modes and carbon impurity concentration. [EPAPS]
- J. F. Schooley, W. R. Hosler, and M. L. Cohen,
Phys. Rev. Lett. 12, 474 (1964) . - T. Ohnishi, K. Shibuya, T. Yamamoto, and M. Lippmaa, J. Appl. Phys. 103, 103703 (2008).
- C. M. Brooks, L. F. Kourkoutis, T. Heeg, J. Schubert, D. A. Muller, and D. G. Schlom, Appl. Phys. Lett. 94, 162905 (2009).
- R. H. Lamoreaux, D. L. Hildenbrand, and L. Brewer,
J. Phys. Chem. Ref. Data 16, 419 (1987) . - I. Barin, Thermochemical Data of Pure Substances, 3rd ed. (VCH, Weinheim, 1995), Vols. I-II.







