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Surface scattering effect on the electrical resistivity of single crystalline silver nanowires self-assembled on vicinal Si (001)

Appl. Phys. Lett. 95, 103112 (2009); doi:10.1063/1.3216836

Published 10 September 2009

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Qiaojian Huang,1 Carmen M. Lilley,1 and Matthias Bode2
1Department of Mechanical and Industrial Engineering, University of Illinois at Chicago, 3055 Engineering Research Facility, 842 W. Taylor Street, Chicago, Illinois 60607, USA
2Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439, USA
Fundamental questions as to the nature of electron surface scattering in nanoscale materials remain unanswered. In order to isolate the effects of surface scattering from grain boundary scattering, single crystalline trapezoidal silver (Ag) nanowires were self-assembled on vicinal silicon substrate. The well established kinetic theory to model electron surface scattering effects on the electrical resistivity of nanowires was extended to include trapezoidal geometries. The experimentally measured electrical resistivity for Ag nanowires was found to fit the theoretical resistivity for the case of electrons diffusely scattering from the nanowire surface. ©2009 American Institute of Physics
History: Received 19 May 2009; accepted 12 August 2009; published 10 September 2009
Permalink: http://link.aip.org/link/?APPLAB/95/103112/1
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Supplemental Material

KEYWORDS and PACS

Keywords
PACS
  • 73.63.-b
    Electronic transport in nanoscale materials and structures
  • 72.15.Eb
    Electrical and thermal conduction in crystalline metals and alloys
  • 72.15.Qm
    Scattering mechanisms and Kondo effect (metals/alloys)
  • 79.20.-m
    Surface impact phenomena
  • 81.16.Dn
    Self-assembly in nanofabrication and processing
  • YEAR: 2009

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ISSN:
0003-6951 (print)   1077-3118 (online)
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