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An oxide thermal rectifier

Appl. Phys. Lett. 95, 171905 (2009); doi:10.1063/1.3253712

Published 29 October 2009

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W. Kobayashi,1 Y. Teraoka,2 and I. Terasaki3
1Waseda Institute for Advanced Study, Waseda University, Tokyo 169-8050, Japan and PRESTO, Japan Science and Technology Agency, Saitama 332-0012, Japan
2Department of Physics, Waseda University, Tokyo 169-8555, Japan
3Department of Applied Physics, Waseda University, Tokyo 169-8555, Japan
We have experimentally demonstrated thermal rectification as bulk effect. According to a theoretical design of a thermal rectifier, we have prepared an oxide thermal rectifier made of two cobalt oxides with different thermal conductivities, and have made an experimental system to detect the thermal rectification. The rectifying coefficient of the device is found to be 1.43, which is in good agreement with the numerical calculation. ©2009 American Institute of Physics
History: Received 13 June 2009; accepted 2 October 2009; published 29 October 2009
Permalink: http://link.aip.org/link/?APPLAB/95/171905/1
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KEYWORDS and PACS

Keywords
PACS
  • 85.80.Fi
    Thermoelectric devices
  • 47.80.Fg
    Pressure and temperature measurements in fluid dynamics
  • 07.20.Dt
    Thermometers
  • 84.30.Jc
    Power electronics; power supply circuits
  • YEAR: 2009

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PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
Publisher:
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REFERENCES (11)
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  1. B. Li, L. Wang, and G. Casati, Appl. Phys. Lett. 88, 143501 (2006).
  2. L. Wang and B. Li, Phys. Rev. Lett. 99, 177208 (2007).
  3. L. Wang and B. Li, Phys. Rev. Lett. 101, 267203 (2008).
  4. M. Terraneo, M. Peyrard, and G. Casati, Phys. Rev. Lett. 88, 094302 (2002).
  5. B. Li, J. Lan, and L. Wang, Phys. Rev. Lett. 95, 104302 (2005).
  6. M. Peyrard, Europhys. Lett. 76, 49 (2006).
  7. G. Casati, C. Mejía-Monasterio, and T. Prosen, Phys. Rev. Lett. 98, 104302 (2007).
  8. N. Yang, N. Li, L. Wang, and B. Li, Phys. Rev. B 76, 020301(R) (2007).
  9. M. Hu, P. Keblinski, and B. Li, Appl. Phys. Lett. 92, 211908 (2008).
  10. C. W. Chang, D. Okawa, A. Majumdar, and A. Zettl, Science 314, 1121 (2006).
  11. K. Berggold, M. Kriener, C. Zobel, A. Reichl, M. Reuther, R. Müller, A. Freimuth, and T. Lorenz, Phys. Rev. B 72, 155116 (2005).

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