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In situ probing of electromechanical properties of an individual ZnO nanobelt

Appl. Phys. Lett. 95, 172106 (2009); doi:10.1063/1.3241075

Published 29 October 2009

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Anjana Asthana,1 Kasra Momeni,1 Abhishek Prasad,2 Yoke Khin Yap,2 and Reza Shahbazian Yassar1
1Department of Mechanical Engineering-Engineering Mechanics, Michigan Technological University, Houghton, Michigan 49931, USA
2Department of Physics, Michigan Technological University, Houghton, Michigan 49931, USA
We report here, an investigation on electrical and structural-microstructural properties of an individual ZnO nanobelt via in situ transmission electron microscopy using an atomic force microscopy (AFM) system. The I-V characteristics of the ZnO nanobelt, just in contact with the AFM tip indicates the insulating behavior, however, it behaves like a semiconductor under applied stress. Analysis of the high resolution lattice images and the corresponding electron diffraction patterns shows that each ZnO nanobelt is a single crystalline, having wurtzite hexagonal structure (a=0.324  nm, c=0.520 66  nm) with a general growth direction of [10[overline 1]0]. ©2009 American Institute of Physics
History: Received 12 August 2009; accepted 1 September 2009; published 29 October 2009
Permalink: http://link.aip.org/link/?APPLAB/95/172106/1
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KEYWORDS and PACS

Keywords
PACS
  • 73.63.Bd
    Nanocrystalline materials (electronic transport)
  • 72.20.-i
    Electrical conductivity phenomena in semiconductors and insulators
  • 72.80.Ey
    Electrical conductivity of III-V and II-VI semiconductors
  • 77.65.-j
    Piezoelectricity and electromechanical effects
  • 61.46.Df
    Structure of nanocrystals and nanoparticles
  • YEAR: 2009

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PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
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