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In vacuo measurement of the sensitivity limit of planar Bragg grating sensors for monolayer detection

Appl. Phys. Lett. 95, 173306 (2009); doi:10.1063/1.3257727

Published 30 October 2009

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Richard M. Parker,1,2 James C. Gates,1 Martin C. Grossel,2 and Peter G. R. Smith1
1Optoelectronics Research Centre, University of Southampton, Southampton SO17 1BJ, United Kingdom
2School of Chemistry, University of Southampton, Southampton SO17 1BJ, United Kingdom
An exposed Bragg grating incorporated into a planar waveguide was used to form an optical device that acts as a refractive index sensor. The exposed evanescent field causes the Bragg peak to be sensitive to the refractive index of its surroundings. The corresponding shift in peak wavelength can be used to detect changes in this environment. Incorporation of a high index overlayer onto the surface has been shown to dramatically enhance this sensitivity. The sensitivity limit was measured via the deposition of a thin film of silica, demonstrating that the system can measure down to a single surface monolayer. ©2009 American Institute of Physics
History: Received 19 August 2009; accepted 8 October 2009; published 30 October 2009
Permalink: http://link.aip.org/link/?APPLAB/95/173306/1
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ISSN:
0003-6951 (print)   1077-3118 (online)
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