Comment on “Comparison of air breakdown and substrate injection as mechanisms to induce dielectric charging in microelectromechanical switches” [Appl. Phys. Lett. 92, 043502 (2008)]
The purpose of this comment is to provide additional insight into the reliability of microelectromechanical capacitive switches (MEMSs) investigated by Molinero and Castañer [Appl. Phys. Lett. ...
The purpose of this comment is to provide additional insight into the reliability of microelectromechanical capacitive switches (MEMSs) investigated by Molinero and Castañer [Appl. Phys. Lett. ...
Erratum: “High domain wall velocities induced by current in ultrathin Pt/Co/AlOx wires with perpendicular magnetic anisotropy” [Appl. Phys. Lett. 93, 262504 (2008)]
Erratum: “Electroconductance in single-wall carbon nanotubes” [Appl. Phys. Lett. 95, 032111 (2009)]
Appl. Phys. Lett. 95, 179901 (2009); doi:10.1063/1.3257362
Published 29 October 2009
You are logged in to this journal.
Abstract not available.
©2009 American Institute of Physics| History: | Received 6 October 2009; accepted 8 October 2009; published 29 October 2009 |
| Permalink: |
http://link.aip.org/link/?APPLAB/95/179901/1 |
| FULL TEXT OPTIONS | (FREE) |
|
|
|
|
Connotea
CiteULike
del.icio.us
BibSonomy
EDITORIALLY RELATED
- Electroconductance in single-wall carbon nanotubes
Manu Jaiswal et al.
Appl. Phys. Lett. 95, 032111 (2009)
KEYWORDS and PACS
RELATED DATABASES
PUBLICATION DATA
0003-6951 (print)
1077-3118 (online)
AIP
There are no references.
