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Enhanced thermal stability of Pt electrodes for flat epitaxial biferroic-YMnO3/Pt heterostructures

Appl. Phys. Lett. 95, 181907 (2009); doi:10.1063/1.3259417

Published 5 November 2009

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R. Bachelet,1 R. Muralidharan,1 F. Rigato,1 N. Dix,1 X. Martí,1 J. Santiso,2 F. Sánchez,1 and J. Fontcuberta1
1Institut de Ciència de Materials de Barcelona—CSIC, Campus UAB, 08193 Bellaterra, Spain
2Centro de Investigación en Nanociencia y Nanotecnología, CIN2 (CSIC-ICN), Bellaterra 08193, Spain
We have investigated the thermal stability of platinum electrodes on oxide substrates for oxide-based devices. We show that flat epitaxial Pt(111) bottom electrodes, deposited on SrTiO3(111) and Al2O3(0001) substrates, can be stable against dewetting up to usual oxide-deposition temperatures (Ts) by increasing Pt film thickness (tPt) and preferably using SrTiO3(111) rather than Al2O3(0001) substrates. Subsequently, high-quality epitaxial biferroic YMnO3/Pt/oxide-substrate heterostructures have been grown. A diagram of morphological and crystalline quality versus tPt and Ts is given for both YMnO3/Pt/SrTiO3(111) and YMnO3/Pt/Al2O3(0001) heterostructures. These results shall guideline the growth of other functional oxide thin films on Pt electrodes. ©2009 American Institute of Physics
History: Received 29 May 2009; accepted 14 October 2009; published 5 November 2009
Permalink: http://link.aip.org/link/?APPLAB/95/181907/1
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KEYWORDS and PACS

Keywords
PACS
  • 68.60.Dv
    Thermal stability of thin films; thermal effects
  • 81.15.-z
    Methods of deposition of films and coatings
  • 77.80.-e
    Ferroelectricity and antiferroelectricity
  • 77.84.Bw
    Dielectric, piezoelectric, and ferroelectric elements, oxides, nitrides, borides, carbides, chalcogenides, etc
  • 68.55.-a
    Thin film structure and morphology
  • YEAR: 2009

PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (18)
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