Applied Physics Letters
Feedback | Help | Exit
Applied Physics Letters
   
 
 
 
Previous Article
Transfer of graphene layers grown on SiC wafers to other substrates and their integration into field effect transistors
This letter presents a simple method for transferring epitaxial sheets of graphene on silicon carbide to other substrates. The graphene was grown on the (0001) face of 6H-SiC by thermal annealing at 1...
Next Article
Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry
The free electron properties of nonpolar (110)-oriented and semipolar (101)-oriented wurtzite InN films are studied by generalized infrared ellipsometry (GIRSE). We demonstrate the sensitivity of GIRS...

Charge sensing in enhancement mode double-top-gated metal-oxide-semiconductor quantum dots

Appl. Phys. Lett. 95, 202102 (2009); doi:10.1063/1.3259416

Published 17 November 2009

You are not logged in to this journal. Log in

E. P. Nordberg,1,2 H. L. Stalford,1,3 R. Young,1 G. A. Ten Eyck,1 K. Eng,1 L. A. Tracy,1 K. D. Childs,1 J. R. Wendt,1 R. K. Grubbs,1 J. Stevens,1 M. P. Lilly,4 M. A. Eriksson,2 and M. S. Carroll1
1Sandia National Laboratories, Albuquerque, New Mexico 87185, USA
2University of Wisconsin-Madison, Madison, Wisconsin 53706, USA
3University of Oklahoma, Norman, Oklahoma 73019, USA
4Center for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, New Mexico 87185, USA
Laterally coupled charge sensing of quantum dots is highly desirable because it enables measurement even when conduction through the quantum dot itself is suppressed. In this work, we demonstrate such charge sensing in a double-top-gated metal-oxide-semiconductor system. The current through a point contact constriction integrated near a quantum dot shows sharp 2% changes corresponding to charge transitions between the dot and a nearby lead. We extract the coupling capacitance between the charge sensor and the quantum dot, and we show that it agrees well with a three-dimensional capacitance model of the integrated sensor and quantum dot system. ©2009 American Institute of Physics
History: Received 18 September 2009; accepted 14 October 2009; published 17 November 2009
Permalink: http://link.aip.org/link/?APPLAB/95/202102/1
BUY THIS ARTICLE   (US$28)
Download HTML Download Sectioned HTML Download PDF (271 kB) View Cart

KEYWORDS and PACS

Keywords
PACS
  • 73.40.Qv
    Electrical properties of metal-insulator-semiconductor structures
  • 73.63.Kv
    Quantum dots (electronic transport)
  • YEAR: 2009

RELATED DATABASES


To view database links for this article,
you need to log in.
To view database links for this article,
you need to log in.

PUBLICATION DATA

ISSN:
0003-6951 (print)   1077-3118 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (22)
View in Separate Window/Tab
For access to fully linked references, you need to log in. For access to fully linked references, you need to Log in.
  1. D. Loss and D. P. DiVincenzo, Phys. Rev. A 57, 120 (1998).
  2. R. Vrijen, E. Yablonovitch, K. Wang, H. W. Jiang, A. Balandin, V. Roychowdhury, T. Mor, and D. DiVincenzo, Phys. Rev. A 62, 012306 (2000).
  3. M. Friesen, P. Rugheimer, D. E. Savage, M. G. Lagally, D. W. van der Weide, R. Joynt, and M. A. Eriksson, Phys. Rev. B 67, 121301 (2003).
  4. A. Morello, C. C. Escott, H. Huebl, L. H. W. v. Beveren, L. C. L. Hollenberg, D. N. Jamieson, A. S. Dzurak, and R. G. Clark, Phys. Rev. B 80, 081307(R) (2009).
  5. J. M. Elzerman, R. Hanson, L. H. W. van Beveren, B. Witkamp, L. M. K. Vandersypen, and L. P. Kouwenhoven, Nature (London) 430, 431 (2004).
  6. J. R. Petta, A. C. Johnson, J. M. Taylor, E. A. Laird, A. Yacoby, M. D. Lukin, C. M. Marcus, M. P. Hanson, and A. C. Gossard, Science 309, 2180 (2005).
  7. N. Shaji, C. B. Simmons, M. Thalakulam, L. J. Klein, H. Qin, H. Luo, D. E. Savage, M. G. Lagally, A. J. Rimberg, R. Joynt, M. Friesen, R. H. Blick, S. N. Coppersmith, and M. A. Eriksson, Nat. Phys. 4, 540 (2008).
  8. H. W. Liu, T. Fujisawa, Y. Ono, H. Inokawa, A. Fujiwara, K. Takashina, and Y. Hirayama, Phys. Rev. B 77, 073310 (2008).
  9. S. J. Angus, A. J. Ferguson, A. S. Dzurak, and R. G. Clark, Nano Lett. 7, 2051 (2007).
  10. N. Zimmerman, B. Simonds, A. Fujiwara, Y. Ono, Y. Takahashi, and H. Inokawa, Appl. Phys. Lett. 90, 033507 (2007).
  11. E. P. Nordberg, G. A. Ten Eyck, H. A. Stalford, R. P. Muller, R. W. Young, K. Eng, L. A. Tracy, K. D. Childs, J. R. Wendt, R. K. Grubbs, J. Stevens, M. P. Lilly, M. A. Eriksson, and M. S. Carroll, Phys. Rev. B 80, 005331 (2009).
  12. M. Field, C. G. Smith, M. Pepper, D. A. Ritchie, J. Frost, G. Jones, and D. Hasko, Phys. Rev. Lett. 70, 1311 (1993).
  13. A. C. Johnson, J. R. Petta, J. M. Taylor, A. Yacoby, M. D. Lukin, C. M. Marcus, M. P. Hanson, and A. C. Gossard, Nature (London) 435, 925 (2005).
  14. F. H. L. Koppens, C. Buizert, K. J. Tielrooij, I. T. Vink, K. C. Nowack, T. Meunier, L. P. Kouwenhoven, and L. M. K. Vandersypen, Nature (London) 442, 766 (2006).
  15. M. Pioro-Ladriere, T. Obata, Y. Tokura, Y. S. Shin, T. Kubo, K. Yoshida, T. Taniyama, and S. Tarucha, Nat. Phys. 4, 776 (2008).
  16. J. M. Elzerman, R. Hanson, J. S. Greidanus, L. H. W. van Beveren, S. De Franceschi, L. M. K. Vandersypen, S. Tarucha, and L. P. Kouwenhoven, Phys. Rev. B 67, 161308 (2003).
  17. C. B. Simmons, M. Thalakulam, N. Shaji, L. J. Klein, H. Qin, R. H. Blick, D. E. Savage, M. G. Lagally, S. N. Coppersmith, and M. A. Eriksson, Appl. Phys. Lett. 91, 213103 (2007).
  18. C. B. Simmons, M. Thalakulam, E. Sackmann, B. Van Bael, R. Joynt, M. F. Friesen, S. N. Coppersmith, D. E. Savage, and M. A. Eriksson, Nano Lett. 9, 3234 (2009).
  19. K. Y. Tan, K. W. Chan, M. Möttönen, A. Morello, C. Yang, J. van Donkelaar, A. Alves, J. M. Pirkkalainen, D. N. Jamieson, R. G. Clark, and A. S. Dzurak, arXiv:0905.4358v2.
  20. J. A. Seamons, E. Bielejec, M. S. Carroll, and K. D. Childs, Appl. Phys. Lett. 93, 043124 (2008).
  21. ESI Group, Paris, France, 2008.
  22. C. Barthel, D. J. Reilly, C. M. Marcus, M. P. Hanson, and A. C. Gossard, Phys. Rev. Lett. 103, 160503 (2009).

CITING ARTICLES
For access to citing articles, you need to log in.
For access to citing articles, you need to Log in.


Copyright © American Institute of Physics