Screw dislocation in a two-phase isotropic thin film

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By using the complex potential and conformal mapping techniques, the stress field of a straight screw dislocation lying parallel to the surface of a two-phase isotropic thin film of equal thickness in each phase and a welded interface is analyzed. The solution, when reduced to a single-phase thin film, is in agreement with that derived by Liebfried and Dietze using an infinite array of image dislocations. The presence of a second phase is found to increase the magnitude of the stress components for the screw dislocation except for _xz near the interface where the effect is the reverse. The image force on the dislocation near the interface can be attractive or repulsive depending upon whether the dislocation is situated in the hard or soft phase. In the case where the dislocation is situated in the soft phase, the total image force tends to drive the screw dislocation to the surface. Furthermore, the screw dislocation is found to be unstable at the interface. The elastic solution for an interfacial dislocation becomes a special case. Journal of Applied Physics is copyrighted by The American Institute of Physics.