Journal of Applied Physics
Feedback | Help | Exit
Journal of Applied Physics
Search:
   
 
 
 
Previous Article
Absolute value of the magnetic moment per atom in Ag/Fe/Ag(001) and Ag/Co/Ag(001) epitaxial sandwich structures
We present the results of an investigation of epitaxial Ag/bcc Fe/Ag(001) and Ag/fcc Co/Ag(001) sandwich structures in which we use polarized neutron reflection (PNR) as a direct probe of the absolute...
Next Article
Structure and magnetic properties of single-crystal Fe/Au(100) superlattices synthesized using RHEED oscillation
Single-crystal bcc-Fe/fcc-Au(100) artificial superlattices have been synthesized by the molecular-beam epitaxy (MBE) method using reflection high-energy electron diffraction (RHEED) intensity oscillat...

A comparative study of the molecular-beam epitaxial growth of Ag/Fe, Ag/Cr, and Fe/Cr superlattices on GaAs (001)

J. Appl. Phys. 67, 5400 (1990); doi:10.1063/1.344566

Issue Date: 1 May 1990

You are logged in to this journal.

P. Etienne, S. Lequien, F. Nguyen-Van-Dau, R. Cabanel, G. Creuzet, and A. Friederich
Thomson-CSF/L.C.R., 91404 Orsay Cedex, France

J. Massies
CNRS, Laboratoire de Physique du Solide et Energie Solaire, Sophia-Antipolis, Rue Bernard Grégory, 06560 Valbonne, France

A. Fert, A. Barthélémy, and F. Petroff
Université Paris-Sud, Laboratoire de Physique du Solide, Bât. 510, 91405 Orsay Cedex, France
Ag/Fe, Ag/Cr, and Fe/Cr superlattices grown on GaAs (001) by molecular-beam epitaxy are compared on the basis of their structural properties. Highly ordered superlattices with very sharp interfaces are obtained for Ag-based structures (Ag/Fe, Ag/Cr). Although several attempts have been made to improve the growth process of Fe/Cr superlattices, they are far from being so well defined. This is a consequence of a progressive degradation which occurs when the superlattice thickness increases and becomes clearly observable in reflection high-energy electron diffraction above roughly 300 Å. However, using an optimum growth temperature, reasonably well-defined structures, suitable for subsequent magnetic studies, are obtained. Journal of Applied Physics is copyrighted by The American Institute of Physics.
Permalink: http://link.aip.org/link/?JAPIAU/67/5400/1
FULL TEXT OPTIONS   (FREE)
Download PDF (476 kB) View Cart

KEYWORDS and PACS

Keywords
PACS
  • 68.55.Bd
    Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) Thin film growth, structure, and epitaxy Molecular and atomic beam epitaxy
  • 75.70.-i
    Magnetic properties and materials Magnetic films and multilayers
  • 68.65.+g
    Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) Layer structures, intercalation compounds, and superlattices: growth, structure, and nonelectronic properties
  • YEAR: 1990

RELATED DATABASES

Scopus

View This Record in Scopus

PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (16)
View in Separate Window/Tab
  1. J. Kwo, E. M. Gyorgy, D. B. McWhan, M. Hong, F. J. Disalvo, C. Vettier, and J. E. Bower, Phys. Rev. Lett. 55, 1402 (1985). [ISI] [MEDLINE]
  2. N. C. Koon, B. T. Jonker, F. A. Volkening, J. J. Krebs, and G. A. Prinz, Phys. Rev. Lett. 59, 2463 (1987). [MEDLINE]
  3. M. N. Baibich, J. M. Broto, A. Fert, F. Nguyen-Van-Dau, F. Petroff, P. Etienne, G. Creuzet, A. Friederich, and J. Chazelas, Phys. Rev. Lett. 61, 2472 (1988). [MEDLINE]
  4. M. Maurer, J. C. Ousset, M. F. Ravet, and M. Piecuch, Europhys. Lett. 9, 803 (1989). [Inspec] [ISI]
  5. M. Copel, M. C. Reuteer, E. Kaxiras, and R. M. Tromp, Phys. Rev. Lett. 63, 632 (1989). [MEDLINE]
  6. T. Etienne, J. Massies, F. Nguyen-Van-Dau, A. Barthélémy, and A. Fert, Appl. Phys. Lett. 55, 2239 (1989). [ISI]
  7. J. Massies and N. T. Linh, J. Cryst. Growth 56, 25 (1982). [Inspec]
  8. R. Ludeke, T. C. Chiang, and D. E. Eastman, J. Vac. Sci. Technol. 21, 599 (1982). [ISI]
  9. R. F. C. Farrow, V. S. Speriosu, S. S. P. Parkin, C. Chien, J. C. Bravman, R. F. Marks, P. D. Kirchner, G. A. Prinz, B. T. Jonker, Mater. Res. Soc. Symp. Proc. 130, 281 (1989).
  10. P. Etienne, G. Creuzet, A. Friederich, F. Nguyen-Van-Dau, A. Fert, and J. Massies, Appl. Phys. Lett. 53, 162 (1988). [ISI]
  11. B. T. Jonker, J. J. Krebs, and G. A. Prinz, Phys. Rev. B 39, 1399 (1989). [ISI] [MEDLINE]
  12. J. J. Krebs, B. T. Jonker, and G. A. Prinz, Mater. Res. Soc. Symp. Proc. 151, 23 (1989).
  13. C. P. Flynn, J. Phys. F 18, L195 (1988). [Inspec] [ISI]
  14. P. Etienne, J. Chazelas, G. Creuzet, A. Friederich, J. Massies, F. Nguyen-Van-Dau, and A. Fert, J. Cryst. Growth 95, 410 (1989).
  15. R. F. C. Farrow, S. S. P. Parkin, U. S. Speriosu, C. H. Wilts, R. B. Beyers, P. Pitner, J. M. Woodall, S. L. Wright, P. D. Kirchner, and G. D. Pettit, Mater. Res. Soc. Symp. Proc. 102, 483 (1987).
  16. A. Fert et al. (these proceedings).

Copyright © American Institute of Physics