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The role of spin-dependent impurity scattering in Fe/Cr giant magnetoresistance multilayers
To probe the mechanism of giant magnetoresistance (GMR) observed in Fe/Cr multilayers, we have sputter deposited at the interfaces of Fe(15 Å)/Cr(12 Å) multilayers an additional, ultrathin...

Layered magnetic structures: Antiferromagnetic-type interlayer coupling and magnetoresistance due to antiparallel alignment

J. Appl. Phys. 69, 4789 (1991); doi:10.1063/1.348230

Issue Date: 15 April 1991

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P. Grünberg, S. Demokritov, A. Fuss, M. Vohl, and J. A. Wolf
Forschungszentrum Jülich, IFF, Postfach 1913, D-5170 Jülich, Federal Republic of Germany
Layered Fe/Cr structures are known to display antiferromagnetic-type interlayer coupling and a new magnetoresistance (MR) effect due to antiparallel magnetization alignment. The strength of the coupling is found to be similar in multilayered structures and in double layers. The oscillatory behavior of the coupling, previously found by Parkin, More, and Roche [Phys. Rev. Lett. 64, 2304 (1990)] on sputtered polycrystalline samples, is here confirmed for epitaxial samples, obtained by thermal evaporation. The new MR effect is interpreted as due to a spin-dependent scattering of the electrons at the Fe-Cr interfaces. The investigations have been extended to Fe/V, Fe/Mn, Fe/Cu, Co/Au, Co/Cr, and Co/Cu structures where the antiparallel alignment of the ferromagnetic layers is obtained via hysteresis effects. A MR effect due to antiparallel alignment, which is strong for Co/Au and Co/Cu but weak in the other cases, has been found. Journal of Applied Physics is copyrighted by The American Institute of Physics.
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KEYWORDS and PACS

Keywords
PACS
  • 75.70.-i
    Magnetic properties and materials Magnetic films and multilayers
  • 73.50.Jt
    Electronic structure and electrical properties of surfaces, interfaces, and thin films Electronic transport phenomena in thin films Galvanomagnetic and other magnetotransport effects (including thermomagnetic effects)
  • YEAR: 1990-91

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PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
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REFERENCES (16)
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  1. P. Grünberg, R. Schreiber, Y. Pang, M. B. Brodsky, and H. Sowers, Phys. Rev. Lett. 57, 2442 (1986). [MEDLINE]
  2. J. J. Krebs, P. Lubitz, A. Chaiken, and G. A. Prinz, Phys. Rev. Lett. 63, 1645 (1989). [ISI] [MEDLINE]
  3. B. Heinrich, Z. Celinski, J. F. Cochran, W. B. Muir, J. Rudd, Q. M. Zhong, A. S. Arrott, K. Myrtle, and J. Kirschner, Phys. Rev. Lett. 64, 673 (1990). [ISI] [MEDLINE]
  4. J. F. Cochran, J. Rudd, W. B. Muir, B. Heinrich, and Z. Celinski, Phys. Rev. B 42, 508 (1990). [ISI] [MEDLINE]
  5. M. N. Baibich, J. M. Broto, A. Fert, F. Nguyen van Dau, F. Petroff, P. Etienne, G. Creuzet, A. Friederich, and J. Chazelas, Phys. Rev. Lett. 61, 2472 (1988). [MEDLINE]
  6. A. Barthelemy, A. Fert, M. N. Baibich, S. Hadjoudj, F. Petroff, P. Etienne, R. Cabanel, S. Lequien, F. Nguyen Van Dau, and G. Creuzet, J. Appl. Phys. 67, 5908 (1990). [ISI]
  7. S. S. Parkin, N. More, and K. P. Roche, Phys. Rev. Lett. 64, 2304 (1990). [MEDLINE]
  8. G. Binasch, P. Grünberg, F. Saurenbach, and W. Zinn, Phys. Rev. B 39, 482 (1989).
  9. J. Barnas, A. Fuss, R. E. Camley, P. Grünberg, and W. Zinn, Phys. Rev. B 42, 8110 (1990). [MEDLINE]
  10. A. Chaiken, G. A. Prinz, and J. J. Krebs, J. Appl. Phys. 67, 4892 (1990). [ISI]
  11. S. Araki and T. Shinjo, Jpn. J. Appl. Phys. 29, L621 (1990).
  12. P. Etienne, J. Massies, F. Nguyen Van Dau, A. Barthelemy, and A. Fert, Appl. Phys. Lett. 55, 2239 (1989), and references therein. [ISI]
  13. F. Hoffman, A. Stankoff, and H. Pascard, J. Appl. Phys. 41, 1022 (1970); [ISI]
    14. F. Hoffman, Phys. Status Solidi 41, 807 (1970). [Inspec] [ISI]
  14. J. Barnas and P. Grünberg, J. Magn. Magn. Mater. 82, 186 (1989); [Inspec] [ISI]
    15. P. Grünberg, Light Scattering in Solids V, edited by Cardona and Giintherodt (Springer, Berlin, 1989), Chap. 8.
  15. P. Grünberg, J. Barnas, F. Saurenbach, A. Fuss, A. Wolf, and M. Vohl, Proceedings of the E-MRS Conference, Strasbourg, June 1990.
  16. H. Bosse, Ph.D. thesis, University of Kassel, Kassel, Germany, 1989.

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