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Both the static and dynamic magnetic properties of sputtered Fe/Cr and Fe/Cu superlattices are compared. The static magnetization is measured by vibrating sample and SQUID magnetometry as well as conv...
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Exchange coupling of ferromagnetic layers across nonmagnetic interlayers (abstract)

J. Appl. Phys. 69, 4802 (1991); doi:10.1063/1.348235

Issue Date: 15 April 1991

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M. Vohl, J. A. Wolf, and P. Grünberg
Forschungszentrum Jülich, IFF, Postfach 1913, D-5170 Jülich, West Germany
The problem of exchange coupling of ferromagnetic layers across nonmagnetic interlayers is of fundamental importance in layered magnetic structures. It is also of importance where these structures are considered for applications. Previously a method has been described how to obtain quantitative information on interlayer coupling from Brillouin light scattering (BLS) from spin waves.1 Here we would like to present new results obtained from samples with wedge-shaped interlayers and discuss the strength of the coupling as a function of the interlayer material and thickness and the growth conditions. In situ characterization of the growth was performed by means of Auger spectroscopy, RHEED, and SPALEED investigations. In some cases like for Fe layers separated by Cu the coupling appears to depend strongly on the crystallinity of the interlayer. Epitaxial interlayers decouple the ferromagnetic films stronger than polycrystalline ones. This observation and its relation to the sometimes observed antiferromagnetic-type interlayer coupling will be discussed. Journal of Applied Physics is copyrighted by The American Institute of Physics.
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PACS

  • 75.70.-i
    Magnetic properties and materials Magnetic films and multilayers
  • 75.50.Bb
    Magnetic properties and materials Studies of specific magnetic materials Fe and its alloys
  • 75.30.Et
    Magnetic properties and materials Magnetically ordered materials: other intrinsic properties Exchange and superexchange interactions
  • 61.14.Hg
    Structure of liquids and solids; crystallography Electron determination of structures by diffraction and scattering Low-energy electron diffraction (LEED) and reflection high-energy electron diffraction (RHEED) techniques
  • YEAR: 1990-91

PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (1)

  1. M. Vohl, J. Barnas, and P. Grünberg, Phys. Rev. B 39, 12 003 (1989). [ISI] [MEDLINE]