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Modeling field dependence of giant magnetoresistance in ``granular'' and quasi-granular magnetic films
Giant magnetoresistance in granular alloy thin films prepared by co-sputtering as well as in quasi-granular disordered multilayers has been modeled with relative ease using a simple scattering concept...
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The absence of giant magnetoresistance on antiferromagnetically coupled NiFe/Cr multilayers
To further investigate the relationship between the giant magnetoresistance (GMR), anisotropic magnetoresistance (AMR), and antiferromagnetic (AFM) coupling found in magnetic multilayers we have depos...

Magnetoresistance in rf-sputtered (NiFe/Cu/Co/Cu) spin-valve multilayers

J. Appl. Phys. 73, 5515 (1993); doi:10.1063/1.353687

Issue Date: 15 May 1993

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D. Lottis, A. Fert, R. Morel, and L. G. Pereira
Laboratoire de Physique des Solides, Bâtiment 510, Université Paris-Sud, 91405 Orsay, France

J. C. Jacquet, P. Galtier, J. M. Coutellier, and T. Valet
Thomson CSF-LCR, Laboratoire de Technologies Magnétiques, Domaine de Corbeville, 91404 Orsay, France
A study of the variation of the magnetoresistance in (Ni80Fe20/Cu/Co/Cu) multilayers with the thicknesses tNiFe, tCo, and tCu of each type of component layer has been performed. The magnetoresistance (MR), which at 4.2 K is larger than 20% for many samples, has been measured for fields applied both parallel and perpendicular to the current. This allows a direct measurement of the anisotropic magnetorestistance as well as an estimate of the spin-valve contribution to the total MR. The dependence of the MR on tCu indicates the presence of an oscillatory interlayer exchange coupling through the Cu layers with a period of about 12 Å. The dependence of the MR on tNiFe and tCo was studied at tCu=50 Å, for which the coupling is negligible. In this limit, the variation of the MR is dominated by the thickness dependence of the NiFe and Co component layer coercivities, which determine the degree of antiparallel alignement obtained during magnetization reversal. Journal of Applied Physics is copyrighted by The American Institute of Physics.
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KEYWORDS and PACS

Keywords
PACS
  • 73.50.Jt
    Electronic structure and electrical properties of surfaces, interfaces, and thin films Electronic transport phenomena in thin films Galvanomagnetic and other magnetotransport effects (including thermomagnetic effects)
  • 73.61.At
    Electronic structure and electrical properties of surfaces, interfaces, and thin films Electrical properties of specific thin films and layer structures Metal and metallic alloys
  • 75.70.Cn
    Magnetic properties and materials Magnetic films and multilayers Interfacial magnetic properties
  • YEAR: 1993

PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
Publisher:
AIP is a member of CrossRef AIP

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