Crystallographic structure of CoPtCr/CrV thin films as revealed by cross-section TEM and x-ray pole-figure analysis and its relevance to magnetic properties
The crystallographic structure and coercive force of Co75Pt12Cr13/CrVx bilayer films sputter deposited on NiP/AlMg disks used in longitudinal magnetic recording were characterized as a function of var...
The crystallographic structure and coercive force of Co75Pt12Cr13/CrVx bilayer films sputter deposited on NiP/AlMg disks used in longitudinal magnetic recording were characterized as a function of var...
Effect of microstructural features on media noise in longitudinal recording media
High-resolution transmission-electron microscopy (HRTEM) has been used to analyze CoCrTa, CoCrPt, and CoNiCrPt alloy thin films deposited under similar conditions onto NiP plated Al substrates with a ...
High-resolution transmission-electron microscopy (HRTEM) has been used to analyze CoCrTa, CoCrPt, and CoNiCrPt alloy thin films deposited under similar conditions onto NiP plated Al substrates with a ...
Effects of platinum content and substrate bias on the structure and magnetic properties of CoCrPt/Cr thin films
J. Appl. Phys. 73, 5563 (1993); doi:10.1063/1.353651
Issue Date: 15 May 1993
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The effects of the Pt content (0–40 at. %) and the developed dc substrate bias voltage (0 to −190 V) on the magnetic properties and structure of rf sputtered CoCrPt/Cr films with two different remanent magnetization-thickness products Mr
(0.7 and 2.3 memu/cm2) were studied. It was demonstrated that a wide range of in-plane coercivities (500–3450 Oe) can be easily obtained in these films. The addition of Pt affected the magnetic properties of the films through changes of the lattice parameter, texture, and phase composition. A maximum in the in-plane coercivity exists for moderate amounts of Pt. The saturation magnetization decreased monotonically with increasing Pt content. rf substrate bias increased the in-plane coercivity and altered the character of the magnetic interactions through changes of the stress, texture and microstructure of the magnetic layer.
Journal of Applied Physics is copyrighted by The American Institute of Physics.
(0.7 and 2.3 memu/cm2) were studied. It was demonstrated that a wide range of in-plane coercivities (500–3450 Oe) can be easily obtained in these films. The addition of Pt affected the magnetic properties of the films through changes of the lattice parameter, texture, and phase composition. A maximum in the in-plane coercivity exists for moderate amounts of Pt. The saturation magnetization decreased monotonically with increasing Pt content. rf substrate bias increased the in-plane coercivity and altered the character of the magnetic interactions through changes of the stress, texture and microstructure of the magnetic layer.
Journal of Applied Physics is copyrighted by The American Institute of Physics.
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BibSonomy
KEYWORDS and PACS
MAGNETIC MATERIALS,
THIN FILMS,
TERNARY ALLOYS,
COBALT ALLOYS,
CHROMIUM ALLOYS,
PLATINUM ALLOYS,
SPUTTERED MATERIALS,
PHASE STUDIES,
LATTICE PARAMETERS,
TEXTURE,
MICROSTRUCTURE,
MAGNETIC PROPERTIES
- 75.70.Fr
Magnetic properties and materials Magnetic films and multilayers Magnetic ordering in multilayers - 75.50.Rr
Magnetic properties and materials Studies of specific magnetic materials Magnetism in interface structures (including layer and superlattice structures) - 68.65.+g
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) Layer structures: multilayers, and superlattices (growth, structure, and nonelectronic properties) - 81.15.Cd
Materials science Methods of deposition of films and coatings Deposition by sputtering - YEAR: 1993
RELATED DATABASES
PUBLICATION DATA
0021-8979 (print)
1089-7550 (online)
AIP
REFERENCES (10)
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