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Crystallographic anisotropy in thin film magnetic recording media analyzed with x-ray diffraction

J. Appl. Phys. 73, 7591 (1993); doi:10.1063/1.353979

Issue Date: 1 June 1993

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H. Kataoka
Production Engineering Research Lab, Hitachi Corporation, Yokohama, Japan

J. A. Bain
Department of Materials Science and Engineering, Stanford University, Stanford, California 94305-2205

S. Brennan
Stanford Synchrotron Radiation Laboratory, Stanford, California 94309

B. M. Clemens
Department of Materials Science and Engineering, Stanford University, Stanford, California 93405-2205
The crystallographic anisotropy of CoCr alloy films deposited on a Cr underlayer was investigated with grazing incidence x-ray scattering (GIXS). The effect of circumferential mechanical texturing of the NiP substrate (producing microgrooves through polishing) was explored. The Co was found to grow heteroepitaxially on the Cr underlayer with the Co(112-bar 0) growth planes parallel to the Cr(001) growth planes. We observe no significant differences in Co lattice parameter in the circumferential and radial directions, although we do see variations in crystallographic texture between these two directions. From GIXS peak intensities, we observe that there is a greater population of crystallites with their c axis pointed along the grooves. This analysis was done after allowing for the effect of the varying local surface normal due to the substrate grooves. The ratio of the coercivities in the two directions scales with the ratios of the c-axis population densities. Two simple quantitative models of the magnetic properties of the aggregate have been constructed: strongly coupled grains and uncoupled grains. The predictions of these models are compared to the observed properties. Journal of Applied Physics is copyrighted by The American Institute of Physics.
History: Received 20 February 1992; accepted 5 February 1993
Permalink: http://link.aip.org/link/?JAPIAU/73/7591/1
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KEYWORDS and PACS

Keywords
PACS
  • 75.70.Ak
    Magnetic properties and materials Magnetic films and multilayers Magnetic properties of monolayers and overlayers
  • 68.55.Jk
    Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) Thin film growth, structure, and epitaxy Structure and morphology; thickness
  • 61.10.Lx
    Structure of solids and liquids; crystallography X-ray diffraction and scattering Experimental diffraction and scattering techniques (including small-angle scattering, EXAFS, NEXAFS, and XANES)
  • 75.30.Gw
    Magnetic properties and materials Magnetically ordered materials: other intrinsic properties Magnetic anisotropy
  • YEAR: 1993

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PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
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REFERENCES (12)
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