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Strong uniaxial magnetic anisotropy of nanostripes obtained by cutting thin epitaxial Fe layer using the atomic saw method

J. Appl. Phys. 81, 5464 (1997); doi:10.1063/1.364626

Issue Date: 15 April 1997

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L. Ressier
Laboratoire de Physique des Solides-INSA, Complexe Scientifique de Rangueil, F-31077 Toulouse, France

A. Schuhl and F. Nguyen Van Dau
Unité mixte de recherches Thomson CSF-CNRS, Laboratoire Central de Recherches, Domaine de Corbeville, 91404 Orsay, France

K. Postava, M. Goiran, J. P. Peyrade, and A. R. Fert
Laboratoire de Physique des Solides-INSA, Complexe Scientifique de Rangueil, F-31077 Toulouse, France
We have applied the "atomic saw" method developed on semiconductor heterostructures to cut thin epitaxial Fe films deposited on (001) MgO substrate into Fe nanostripes. This method is based on dislocation slipping. We have controlled the slip along the (110) MgO planes and obtained Fe stripes along the [110] direction. We present the magnetic study of 2- and 5-nm-thick Fe films which have been cut by this method, with a deformation up to 8%. The surface of the deformed film, studied by atomic force microscopy, is characterized by regular steps, a few nm high, and from 50 nm to 2 µm wide, depending on the slipping plane density. Strong uniaxial magnetic anisotropy has been observed by magneto-optical measurements. Surprisingly, the easy magnetic axis is perpendicular to the nanostripes. Various possible mechanisms are discussed. However, it results probably in the relaxation of the elastic strain field at the Fe/MgO interface. ©1997 American Institute of Physics.
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KEYWORDS and PACS

Keywords
PACS
  • 75.30.Gw
    Magnetic properties and materials Intrinsic properties of magnetically ordered materials Magnetic anisotropy
  • 75.70.Ak
    Magnetic properties and materials Magnetic films and multilayers Magnetic properties of monolayers and thin films
  • 75.50.Bb
    Magnetic properties and materials Studies of specific magnetic materials Fe and its alloys
  • 61.72.Hh
    Structure of solids and liquids; crystallography Defects and impurities in crystals; microstructure Indirect evidence of dislocations and other defects (resistivity, slip, creep, strains, internal friction, EPR, NMR, etc.)
  • 78.20.Ls
    Optical properties, condensed matter spectroscopy and other interactions of radiation and particles with condensed matter Optical properties of bulk materials and thin films Magnetooptical effects
  • 68.35.Bs
    Surfaces and interfaces; thin films and whiskers (Structure and nonelectronic properties) Solid surfaces and solidsolid interfaces Surface structure and topography
  • 62.20.Fe
    Mechanical and acoustical properties of condensed matter Mechanical properties of solids Deformation and plasticity (including yield, ductility, and superplasticity)
  • YEAR: 1996-97

PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
Publisher:
AIP is a member of CrossRef AIP

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