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Oscillation of the cantilever in atomic force microscopy: Probing the sample response at the microsecond scale
The relaxation of an atomic force microscope microlever is investigated after the unsticking instability. We show that the different oscillating behavior can be explained by considering that polymer c...

Dynamic force microscopy by means of the phase-controlled oscillator method

J. Appl. Phys. 82, 3641 (1997); doi:10.1063/1.365726

Issue Date: 15 October 1997

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U. Dürig and H. R. Steinauer
IBM Research Division, Zurich Research Laboratory, CH–8803 Rüschlikon, Switzerland

N. Blanc
Paul Scherrer Institute Zurich, Badenerstrasse 569, CH–8048 Zürich, Switzerland
Dynamic force microscopy, a technique also known as non-contact force microscopy, has proved to be a powerful tool for atomic resolution imaging. A number of schemes have been developed, but recently the oscillator method has become the preferred operating mode. Here, the force sensor acts as resonator in an active feedback circuit. A practical implementation of the method is described and the underlying key concepts are discussed. It is shown that a tracking oscillator excitation scheme is superior to the more standard direct feedback method for cases in which the force sensor exhibits only a weak resonance enhancement. Furthermore, the simultaneous measurement of dissipative interaction channels is an important extension of dynamic force microscopy. It allows one to differentiate between sample materials via their plasto-mechanical response. As an example, a Cr test grating has been imaged in the constant force gradient mode. The dissipation measured on Cr-covered areas is significantly lower than that on the bare quartz glass substrate, which enables one to distinguish between the two materials with a lateral resolution comparable to that of the topographic image. ©1997 American Institute of Physics.
History: Received 3 June 1997; accepted 15 July 1997
Permalink: http://link.aip.org/link/?JAPIAU/82/3641/1
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KEYWORDS and PACS

Keywords
PACS
  • 07.79.Lh
    Instruments, apparatus, components, and techniques common to several branches of physics and astronomy Scanning probe microscopes, components, and techniques Atomic force microscopes
  • 84.30.Ng
    Electronics: radiowave and microwave technology; direct energy conversion and storage Electronic circuits Oscillators, pulse generators, and function generators
  • 61.16.Ch
    Structure of solids and liquids; crystallography Electron, ion, and scanning probe microscopy Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc.
  • YEAR: 1996-97

PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (19)
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