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A method for calibrating the force gradients and probe magnetic moment in phase-contrast magnetic force microscopy (MFM) is introduced. It is based upon the combined electrostatic force microscopy EFM...
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Magneto-optical effects are calculated for the film stack consisting of hemisphere glass/magnetic film (10 nm)/air gap (d nm)/glass plate. Polarized light (wave length=800 nm) is irradiated through th...

Magnetic force microscopy using nonoptical piezoelectric quartz tuning fork detection design with applications to magnetic recording studies

J. Appl. Phys. 83, 6229 (1998); doi:10.1063/1.367642

Issue Date: 1 June 1998

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M. Todorovic and S. Schultz
Department of Physics and Center for Magnetic Recording Research, University of California, San Diego, La Jolla, California 92093-0401
We have developed a novel form of magnetic force microscopy that uses a commercial piezoelectric quartz tuning fork to detect magnetic forces and force gradients. Such a detection system is extremely simple and inexpensive, compared to conventional optical methods of cantilever vibration detection. The setup is, in addition, characterized by small size, which makes it attractive for studies done in constrained spaces. The instrument is first described, then theoretical comparison of signal to noise ratio and resolution is made with the conventional optical detection techniques of cantilever vibration, and finally, first images of thin film media commercial hard disk magnetic bit transitions, point response of magnetoresistive elements, and field gradients above the write gap of a commercial hard disk head are presented. ©1998 American Institute of Physics.
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KEYWORDS and PACS

Keywords
PACS
  • 07.79.Pk
    Instruments, apparatus, components, and techniques common to several branches of physics and astronomy Scanning probe microscopes, components, and techniques Magnetic force microscopes
  • 07.55.Yv
    Instruments, apparatus, components, and techniques common to several branches of physics and astronomy Magnetic components, instruments and techniques Other magnetic instruments and techniques
  • 85.50.+k
    Electronic and magnetic devices; microelectronics Dielectric, ferroelectric, and piezoelectric devices
  • 85.70.Kh
    Electronic and magnetic devices; microelectronics Magnetic devices Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.); domain-motion devices, etc.
  • YEAR: 1998

PUBLICATION DATA

ISSN:
0021-8979 (print)   1089-7550 (online)
Publisher:
AIP is a member of CrossRef AIP

REFERENCES (12)
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