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1/f noise in pentacene and poly-thienylene vinylene thin film transistors

J. Appl. Phys. 91, 719 (2002); doi:10.1063/1.1423389

Issue Date: 15 January 2002

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L. K. J. Vandamme, R. Feyaerts, and Gy. Trefán
Department of Electrical Engineering EH 5.15, Eindhoven University of Technology, 5600 MB Eindhoven, The Netherlands

C. Detcheverry
Philips Research Laboratories, 5656 AA Eindhoven, The Netherlands
We investigate low frequency conductivity noise in the drain-source channel of organic material field-effect transistors by measuring the spectra of current fluctuations for several values of the gate voltage Vgs and drain voltage Vds and find that it is 1/f. The samples are biased in the ohmic range of the applied Vds. The relative current 1/f noise is inversely proportional to the charge carrier numbers N generated by illumination or by varying the gate-source voltage. Hooge's empirical relation for the 1/f noise is validated for these organic semiconductors with an alpha~=0.01 for poly-thienylene vinylene and about 100 for pentacene thin film transistors. From geometry dependence of the noise we conclude that series resistance can be ignored for poly-thienylene vinylene field-effect transistors. However, some pentacene samples suffer from a noisy series resistance to the channel resistance. From the 1/f noise dependence on geometry and gate voltage bias we conclude that it can be used as a diagnostic tool for device quality assessment. ©2002 American Institute of Physics.
History: Received 25 June 2001; accepted 5 October 2001
Permalink: http://link.aip.org/link/?JAPIAU/91/719/1
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KEYWORDS and PACS

Keywords
PACS
  • 85.30.Tv
    Electronic and magnetic devices; microelectronics Semiconductor devices Field effect devices
  • 72.70.+m
    Electronic transport in condensed matter Noise processes and phenomena
  • 73.50.Td
    Electronic structure and electrical properties of surfaces, interfaces, thin films, and low-dimensional structures Electronic transport phenomena in thin films Noise processes and phenomena
  • 85.30.De
    Electronic and magnetic devices; microelectronics Semiconductor devices Semiconductor-device characterization, design, and modeling
  • YEAR: 2002

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ISSN:
0021-8979 (print)   1089-7550 (online)
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